Transient absorption and linear dichroism in self-assembled InAs/GaAs quantum dots

E.W. Bogaart, J.E.M. Haverkort, T.J. Eijkemans, T. Mano, R. Nötzel, J.H. Wolter

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Downloads (Pure)

Abstract

Time-resolved and polarization-resolved measurements are preformed on InAs/GaAs quantum dots by means of time-resolved differential reflection spectroscopy. With this technique, the polarization anisotropy of the absorption bleaching in a quantum dot is measured. The excitation density dependent measurements of the bleaching magnitude, show a strong polarization dependence, which corresponds to linear dichroism. Dichroism with a magnitude of 1.3 is observed, governed by strain within the sample.
Original languageEnglish
Title of host publicationProceedings of the 9th annual symposium of the IEEE/LEOS Benelux Chapter 2-3 December 2004, Ghent, Belgium
Pages307-310
Publication statusPublished - 2004
Event9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium - Ghent, Belgium
Duration: 2 Dec 20043 Dec 2004

Conference

Conference9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium
CountryBelgium
CityGhent
Period2/12/043/12/04

Fingerprint Dive into the research topics of 'Transient absorption and linear dichroism in self-assembled InAs/GaAs quantum dots'. Together they form a unique fingerprint.

Cite this