Transfer of HV and MV faults to LV systems: measurements and simulations

J.B.M. Waes, van; A.P.J. Deursen, van; J. Merwe, van der; P.C.T. Laan, van der; F. Provoost; M.J.M. van Riet; J.F.G. Cobben

Transfer of HV and MV faults to LV systems: measurements and simulations

J.B.M. Waes, van, A.P.J. Deursen, van, J. Merwe, van der, P.C.T. Laan, van der, F. Provoost, M.J.M. van Riet, J.F.G. Cobben

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. China International Conference on Electricity Distribution (CICED 2000)
Place of Publication	Shanghai, China
Pages	3-54-3-59
Publication status	Published - 2000
Event	2000 China International Conference on Electricity Distribution 2000 (CICED 2000) - Shanghai, China Duration: 17 Oct 2000 → 20 Oct 2000

Conference

Conference	2000 China International Conference on Electricity Distribution 2000 (CICED 2000)
Abbreviated title	CICED 2000
Country/Territory	China
City	Shanghai
Period	17/10/00 → 20/10/00

Cite this

@inproceedings{97685c5a8b654373b18651dc9d136f96,

title = "Transfer of HV and MV faults to LV systems: measurements and simulations",

author = "{Waes, van}, J.B.M. and {Deursen, van}, A.P.J. and {Merwe, van der}, J. and {Laan, van der}, P.C.T. and F. Provoost and {van Riet}, M.J.M. and J.F.G. Cobben",

year = "2000",

language = "English",

pages = "3--54--3--59",

booktitle = "Proc. China International Conference on Electricity Distribution (CICED 2000)",

note = "2000 China International Conference on Electricity Distribution 2000 (CICED 2000), CICED 2000 ; Conference date: 17-10-2000 Through 20-10-2000",

}

Waes, van, JBM , Deursen, van, APJ, Merwe, van der, J, Laan, van der, PCT, Provoost, F, van Riet, MJM & Cobben, JFG 2000, Transfer of HV and MV faults to LV systems: measurements and simulations. in Proc. China International Conference on Electricity Distribution (CICED 2000). Shanghai, China, pp. 3-54-3-59, 2000 China International Conference on Electricity Distribution 2000 (CICED 2000), Shanghai, China, 17/10/00.

Transfer of HV and MV faults to LV systems: measurements and simulations. / Waes, van, J.B.M.; Deursen, van, A.P.J.; Merwe, van der, J. et al.
Proc. China International Conference on Electricity Distribution (CICED 2000). Shanghai, China, 2000. p. 3-54-3-59.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Transfer of HV and MV faults to LV systems: measurements and simulations

AU - Waes, van, J.B.M.

AU - Deursen, van, A.P.J.

AU - Merwe, van der, J.

AU - Laan, van der, P.C.T.

AU - Provoost, F.

AU - van Riet, M.J.M.

AU - Cobben, J.F.G.

PY - 2000

Y1 - 2000

M3 - Conference contribution

SP - 3-54-3-59

BT - Proc. China International Conference on Electricity Distribution (CICED 2000)

CY - Shanghai, China

T2 - 2000 China International Conference on Electricity Distribution 2000 (CICED 2000)

Y2 - 17 October 2000 through 20 October 2000

ER -