| Original language | English |
|---|---|
| Title of host publication | National Conference of Standards Laboratories |
| Place of Publication | United States, Dallas |
| Pages | 303-312 |
| Publication status | Published - 1995 |
Traceable dynamic calibration of probes of roundness and roughness testers in the nanometric region using a digital piezo transducer
H. Haitjema
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review