Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy

S. Kuiper; P.M.J. Hof, Van den; G. Schitter

doi:10.3182/20110828-6-IT-1002.01619

Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy

S. Kuiper
, P.M.J. Hof, Van den
, G. Schitter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

7 Citations (Scopus)

2 Downloads (Pure)

Abstract

In Atomic Force Microscopy (AFM), the force between the measurement tip and the sample is controlled in a feedback loop to prevent damage to the tip and sample during imaging, and to convert the measurement of the tip-sample force into an estimation of the sample topography. Dynamical uncertainties of the system pose a strong limitation on the achievable control bandwidth, and on the accuracy of the estimated topography. This contribution discusses an integrated approach to design a robust feedback controller and topography estimator, taking into account the dynamical uncertainties of the imaging system. It is shown that for a given AFM system there exist a direct trade-off between the achievable closed-loop bandwidth and the guaranteed bounds on the topography estimation error due to the dynamic uncertainties in the system.

Original language	English
Title of host publication	Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy
Editors	S. Bittanti, A. Cenedese, S. Zampieri
DOIs	https://doi.org/10.3182/20110828-6-IT-1002.01619
Publication status	Published - 2011
Event	18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress) - Milano, Italy Duration: 28 Aug 2011 → 2 Sept 2011 Conference number: 18 http://www.ifac2011.org/

Conference

Conference	18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress)
Abbreviated title	IFAC 2011
Country/Territory	Italy
City	Milano
Period	28/08/11 → 2/09/11
Internet address	http://www.ifac2011.org/

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10.3182/20110828-6-IT-1002.01619

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Kuiper, S., Hof, Van den, P. M. J., & Schitter, G. (2011). Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy. In S. Bittanti, A. Cenedese, & S. Zampieri (Eds.), Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy https://doi.org/10.3182/20110828-6-IT-1002.01619

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title = "Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy",

abstract = "In Atomic Force Microscopy (AFM), the force between the measurement tip and the sample is controlled in a feedback loop to prevent damage to the tip and sample during imaging, and to convert the measurement of the tip-sample force into an estimation of the sample topography. Dynamical uncertainties of the system pose a strong limitation on the achievable control bandwidth, and on the accuracy of the estimated topography. This contribution discusses an integrated approach to design a robust feedback controller and topography estimator, taking into account the dynamical uncertainties of the imaging system. It is shown that for a given AFM system there exist a direct trade-off between the achievable closed-loop bandwidth and the guaranteed bounds on the topography estimation error due to the dynamic uncertainties in the system.",

author = "S. Kuiper and \{Hof, Van den\}, P.M.J. and G. Schitter",

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doi = "10.3182/20110828-6-IT-1002.01619",

language = "English",

editor = "S. Bittanti and A. Cenedese and S. Zampieri",

booktitle = "Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy",

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Kuiper, S, Hof, Van den, PMJ & Schitter, G 2011, Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy. in S Bittanti, A Cenedese & S Zampieri (eds), Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy. 18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress), Milano, Italy, 28/08/11. https://doi.org/10.3182/20110828-6-IT-1002.01619

Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy. / Kuiper, S.; Hof, Van den, P.M.J.; Schitter, G.
Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy. ed. / S. Bittanti; A. Cenedese; S. Zampieri. 2011.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy

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AU - Hof, Van den, P.M.J.

AU - Schitter, G.

N1 - Conference code: 18

PY - 2011

Y1 - 2011

N2 - In Atomic Force Microscopy (AFM), the force between the measurement tip and the sample is controlled in a feedback loop to prevent damage to the tip and sample during imaging, and to convert the measurement of the tip-sample force into an estimation of the sample topography. Dynamical uncertainties of the system pose a strong limitation on the achievable control bandwidth, and on the accuracy of the estimated topography. This contribution discusses an integrated approach to design a robust feedback controller and topography estimator, taking into account the dynamical uncertainties of the imaging system. It is shown that for a given AFM system there exist a direct trade-off between the achievable closed-loop bandwidth and the guaranteed bounds on the topography estimation error due to the dynamic uncertainties in the system.

AB - In Atomic Force Microscopy (AFM), the force between the measurement tip and the sample is controlled in a feedback loop to prevent damage to the tip and sample during imaging, and to convert the measurement of the tip-sample force into an estimation of the sample topography. Dynamical uncertainties of the system pose a strong limitation on the achievable control bandwidth, and on the accuracy of the estimated topography. This contribution discusses an integrated approach to design a robust feedback controller and topography estimator, taking into account the dynamical uncertainties of the imaging system. It is shown that for a given AFM system there exist a direct trade-off between the achievable closed-loop bandwidth and the guaranteed bounds on the topography estimation error due to the dynamic uncertainties in the system.

U2 - 10.3182/20110828-6-IT-1002.01619

DO - 10.3182/20110828-6-IT-1002.01619

M3 - Conference contribution

BT - Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy

A2 - Bittanti, S.

A2 - Cenedese, A.

A2 - Zampieri, S.

T2 - 18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress)

Y2 - 28 August 2011 through 2 September 2011

ER -

Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy

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