Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy

S. Kuiper, P.M.J. Hof, Van den, G. Schitter

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)

Abstract

In Atomic Force Microscopy (AFM), the force between the measurement tip and the sample is controlled in a feedback loop to prevent damage to the tip and sample during imaging, and to convert the measurement of the tip-sample force into an estimation of the sample topography. Dynamical uncertainties of the system pose a strong limitation on the achievable control bandwidth, and on the accuracy of the estimated topography. This contribution discusses an integrated approach to design a robust feedback controller and topography estimator, taking into account the dynamical uncertainties of the imaging system. It is shown that for a given AFM system there exist a direct trade-off between the achievable closed-loop bandwidth and the guaranteed bounds on the topography estimation error due to the dynamic uncertainties in the system.
Original languageEnglish
Title of host publicationProceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy
EditorsS. Bittanti, A. Cenedese, S. Zampieri
DOIs
Publication statusPublished - 2011
Event18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress) - Milano, Italy
Duration: 28 Aug 20112 Sep 2011
Conference number: 18
http://www.ifac2011.org/

Conference

Conference18th World Congress of the International Federation of Automatic Control (IFAC 2011 World Congress)
Abbreviated titleIFAC 2011
CountryItaly
CityMilano
Period28/08/112/09/11
Internet address

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    Kuiper, S., Hof, Van den, P. M. J., & Schitter, G. (2011). Towards integrated design of a robust feedback controller and topography estimator for atomic force microscopy. In S. Bittanti, A. Cenedese, & S. Zampieri (Eds.), Proceedings of the 18th IFAC World Congress (IFAC 2011), 28 August - 2 September 2011, Milano, Italy https://doi.org/10.3182/20110828-6-IT-1002.01619