Towards automatic control of scanning transmission electron microscopes

Arturo Tejada; Saartje W. van der Hoeven; Arnold J. den Dekker; Paul M.J. Van den Hof

doi:10.1109/CCA.2009.5280968

Towards automatic control of scanning transmission electron microscopes

Arturo Tejada, Saartje W. van der Hoeven, Arnold J. den Dekker, Paul M.J. Van den Hof

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

Abstract

Scanning transmission electron microscopes are the tools of choice for material science research, since they provide information on the internal structure of a wide range of specimens. These sophisticated machines are operated manually by skilled technicians, who execute complex and repetitive procedures, such as measuring nano-particles, using mainly visual feedback. Hence, there is a need for new global control strategies to automate these procedures. These strategies, however, must be based on a firm understanding of the microscopes from the system theoretical perspective. To the best of our knowledge, such perspective is lacking in the literature. Thus, it is provided here through a new modeling framework that facilitates the future development of global control strategies. The paper also aims to introduce scanning transmission electron microscopy as an important and untapped area of application for control engineers.

Original language	English
Title of host publication	2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)
Publisher	Institute of Electrical and Electronics Engineers
Pages	788-793
Number of pages	6
ISBN (Print)	978-1-4244-4601-8
DOIs	https://doi.org/10.1109/CCA.2009.5280968
Publication status	Published - 9 Oct 2009
Externally published	Yes
Event	IEEE Conference on Control Technology and Applications, CCTA 2009 - Saint Petersburg, Russian Federation Duration: 8 Jul 2009 → 10 Jul 2009

Conference

Conference	IEEE Conference on Control Technology and Applications, CCTA 2009
Abbreviated title	CCTA 2009
Country/Territory	Russian Federation
City	Saint Petersburg
Period	8/07/09 → 10/07/09

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10.1109/CCA.2009.5280968

Cite this

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title = "Towards automatic control of scanning transmission electron microscopes",

abstract = "Scanning transmission electron microscopes are the tools of choice for material science research, since they provide information on the internal structure of a wide range of specimens. These sophisticated machines are operated manually by skilled technicians, who execute complex and repetitive procedures, such as measuring nano-particles, using mainly visual feedback. Hence, there is a need for new global control strategies to automate these procedures. These strategies, however, must be based on a firm understanding of the microscopes from the system theoretical perspective. To the best of our knowledge, such perspective is lacking in the literature. Thus, it is provided here through a new modeling framework that facilitates the future development of global control strategies. The paper also aims to introduce scanning transmission electron microscopy as an important and untapped area of application for control engineers.",

author = "Arturo Tejada and {van der Hoeven}, {Saartje W.} and {den Dekker}, {Arnold J.} and {Van den Hof}, {Paul M.J.}",

year = "2009",

month = oct,

day = "9",

doi = "10.1109/CCA.2009.5280968",

language = "English",

isbn = "978-1-4244-4601-8",

pages = "788--793",

booktitle = "2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "IEEE Conference on Control Technology and Applications, CCTA 2009, CCTA 2009 ; Conference date: 08-07-2009 Through 10-07-2009",

}

Tejada, A, van der Hoeven, SW, den Dekker, AJ & Van den Hof, PMJ 2009, Towards automatic control of scanning transmission electron microscopes. in 2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)., 5280968, Institute of Electrical and Electronics Engineers, pp. 788-793, IEEE Conference on Control Technology and Applications, CCTA 2009, Saint Petersburg, Russian Federation, 8/07/09. https://doi.org/10.1109/CCA.2009.5280968

Towards automatic control of scanning transmission electron microscopes. / Tejada, Arturo; van der Hoeven, Saartje W.; den Dekker, Arnold J. et al.
2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC). Institute of Electrical and Electronics Engineers, 2009. p. 788-793 5280968.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Towards automatic control of scanning transmission electron microscopes

AU - Tejada, Arturo

AU - van der Hoeven, Saartje W.

AU - den Dekker, Arnold J.

AU - Van den Hof, Paul M.J.

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AB - Scanning transmission electron microscopes are the tools of choice for material science research, since they provide information on the internal structure of a wide range of specimens. These sophisticated machines are operated manually by skilled technicians, who execute complex and repetitive procedures, such as measuring nano-particles, using mainly visual feedback. Hence, there is a need for new global control strategies to automate these procedures. These strategies, however, must be based on a firm understanding of the microscopes from the system theoretical perspective. To the best of our knowledge, such perspective is lacking in the literature. Thus, it is provided here through a new modeling framework that facilitates the future development of global control strategies. The paper also aims to introduce scanning transmission electron microscopy as an important and untapped area of application for control engineers.

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EP - 793

BT - 2009 IEEE Control Applications, (CCA) & Intelligent Control, (ISIC)

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ER -

Towards automatic control of scanning transmission electron microscopes

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