Towards a pass/fail test method for nonlinear analog circuits

J. Spaandonk, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Place of PublicationUtrecht
PublisherSTW Technology Foundation
Pages225-229
ISBN (Print)90-73461-07-3
Publication statusPublished - 1994
Event1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing - Arnhem
Duration: 24 Mar 199424 Mar 1994

Conference

Conference1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Abbreviated titleProRISC/IEEE
CityArnhem
Period24/03/9424/03/94

Cite this

Spaandonk, van, J. (1994). Towards a pass/fail test method for nonlinear analog circuits. In Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing (pp. 225-229). STW Technology Foundation.