Towards a pass/fail test method for nonlinear analog circuits

J. Spaandonk, van

Towards a pass/fail test method for nonlinear analog circuits

J. Spaandonk, van

Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	225-229
ISBN (Print)	90-73461-07-3
Publication status	Published - 1994
Event	1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing - Arnhem Duration: 24 Mar 1994 → 24 Mar 1994

Conference

Conference	1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Abbreviated title	ProRISC/IEEE
City	Arnhem
Period	24/03/94 → 24/03/94

Cite this

@inproceedings{90417fb7f0ca464c89c899cb75b6ef13,

title = "Towards a pass/fail test method for nonlinear analog circuits",

author = "{Spaandonk, van}, J.",

year = "1994",

language = "English",

isbn = "90-73461-07-3",

pages = "225--229",

booktitle = "Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing",

publisher = "STW Technology Foundation",

note = "1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing, ProRISC/IEEE ; Conference date: 24-03-1994 Through 24-03-1994",

}

TY - GEN

T1 - Towards a pass/fail test method for nonlinear analog circuits

AU - Spaandonk, van, J.

PY - 1994

Y1 - 1994

M3 - Conference contribution

SN - 90-73461-07-3

SP - 225

EP - 229

BT - Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing

PB - STW Technology Foundation

CY - Utrecht

T2 - 1994 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing

Y2 - 24 March 1994 through 24 March 1994

ER -