Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

B.K.C. Kjellander; L.J. IJzendoorn, van; A.M. Jong, de; D.J. Broer; W.J.H. Gennip, van; M.J.A. Voigt, de; J.W. Niemantsverdriet

doi:10.1117/12.526549

Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

B.K.C. Kjellander, L.J. IJzendoorn, van, A.M. Jong, de, D.J. Broer, W.J.H. Gennip, van, M.J.A. Voigt, de, J.W. Niemantsverdriet

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating

Original language	English
Title of host publication	Liquid Crystal Materials, Devices, and Applications X and Projection Displays X
Editors	L.-C. Chien, M.H. Wu
Place of Publication	Bellingham, USA
Publisher	SPIE
Pages	94-101
ISBN (Print)	0-8194-5192-4
DOIs	https://doi.org/10.1117/12.526549
Publication status	Published - 2004
Event	conference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21 - Duration: 19 Jan 2004 → 21 Apr 2004

Publication series

Name	Proceedings of SPIE
Volume	5289
ISSN (Print)	0277-786X

Conference

Conference	conference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21
Period	19/01/04 → 21/04/04
Other	Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21

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Kjellander, B. K. C., IJzendoorn, van, L. J., Jong, de, A. M., Broer, D. J., Gennip, van, W. J. H., Voigt, de, M. J. A., & Niemantsverdriet, J. W. (2004). Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. In L-C. Chien, & M. H. Wu (Eds.), Liquid Crystal Materials, Devices, and Applications X and Projection Displays X (pp. 94-101). (Proceedings of SPIE; Vol. 5289). Bellingham, USA: SPIE. https://doi.org/10.1117/12.526549

Kjellander, B.K.C. ; IJzendoorn, van, L.J. ; Jong, de, A.M. ; Broer, D.J. ; Gennip, van, W.J.H. ; Voigt, de, M.J.A. ; Niemantsverdriet, J.W. / Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. editor / L.-C. Chien ; M.H. Wu. Bellingham, USA : SPIE, 2004. pp. 94-101 (Proceedings of SPIE).

@inproceedings{02abc338b43649e191330c52f7cf3a23,

title = "Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry",

abstract = "Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating",

author = "B.K.C. Kjellander and {IJzendoorn, van}, L.J. and {Jong, de}, A.M. and D.J. Broer and {Gennip, van}, W.J.H. and {Voigt, de}, M.J.A. and J.W. Niemantsverdriet",

year = "2004",

doi = "10.1117/12.526549",

language = "English",

isbn = "0-8194-5192-4",

series = "Proceedings of SPIE",

publisher = "SPIE",

pages = "94--101",

editor = "L.-C. Chien and M.H. Wu",

booktitle = "Liquid Crystal Materials, Devices, and Applications X and Projection Displays X",

address = "United States",

}

Kjellander, BKC, IJzendoorn, van, LJ , Jong, de, AM , Broer, DJ, Gennip, van, WJH, Voigt, de, MJA & Niemantsverdriet, JW 2004, Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. in L-C Chien & MH Wu (eds), Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. Proceedings of SPIE, vol. 5289, SPIE, Bellingham, USA, pp. 94-101, conference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21, 19/01/04. https://doi.org/10.1117/12.526549

Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. / Kjellander, B.K.C.; IJzendoorn, van, L.J.; Jong, de, A.M.; Broer, D.J.; Gennip, van, W.J.H.; Voigt, de, M.J.A.; Niemantsverdriet, J.W.

Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. ed. / L.-C. Chien; M.H. Wu. Bellingham, USA : SPIE, 2004. p. 94-101 (Proceedings of SPIE; Vol. 5289).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

AU - Kjellander, B.K.C.

AU - IJzendoorn, van, L.J.

AU - Jong, de, A.M.

AU - Broer, D.J.

AU - Gennip, van, W.J.H.

AU - Voigt, de, M.J.A.

AU - Niemantsverdriet, J.W.

PY - 2004

Y1 - 2004

N2 - Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating

AB - Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating

U2 - 10.1117/12.526549

DO - 10.1117/12.526549

M3 - Conference contribution

SN - 0-8194-5192-4

T3 - Proceedings of SPIE

SP - 94

EP - 101

BT - Liquid Crystal Materials, Devices, and Applications X and Projection Displays X

A2 - Chien, L.-C.

A2 - Wu, M.H.

PB - SPIE

CY - Bellingham, USA

ER -

Kjellander BKC, IJzendoorn, van LJ , Jong, de AM , Broer DJ, Gennip, van WJH, Voigt, de MJA et al. Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. In Chien L-C, Wu MH, editors, Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. Bellingham, USA: SPIE. 2004. p. 94-101. (Proceedings of SPIE). https://doi.org/10.1117/12.526549

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