Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

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Abstract

Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating
Original languageEnglish
Title of host publicationLiquid Crystal Materials, Devices, and Applications X and Projection Displays X
EditorsL.-C. Chien, M.H. Wu
Place of PublicationBellingham, USA
PublisherSPIE
Pages94-101
ISBN (Print)0-8194-5192-4
DOIs
Publication statusPublished - 2004
Eventconference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21 -
Duration: 19 Jan 200421 Apr 2004

Publication series

NameProceedings of SPIE
Volume5289
ISSN (Print)0277-786X

Conference

Conferenceconference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21
Period19/01/0421/04/04
OtherElectronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21

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Kjellander, B. K. C., IJzendoorn, van, L. J., Jong, de, A. M., Broer, D. J., Gennip, van, W. J. H., Voigt, de, M. J. A., & Niemantsverdriet, J. W. (2004). Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. In L-C. Chien, & M. H. Wu (Eds.), Liquid Crystal Materials, Devices, and Applications X and Projection Displays X (pp. 94-101). (Proceedings of SPIE; Vol. 5289). Bellingham, USA: SPIE. https://doi.org/10.1117/12.526549