Abstract
| Original language | English |
|---|---|
| Title of host publication | Liquid Crystal Materials, Devices, and Applications X and Projection Displays X |
| Editors | L.-C. Chien, M.H. Wu |
| Place of Publication | Bellingham, USA |
| Publisher | SPIE |
| Pages | 94-101 |
| ISBN (Print) | 0-8194-5192-4 |
| DOIs | |
| Publication status | Published - 2004 |
| Event | conference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21 - Duration: 19 Jan 2004 → 21 Apr 2004 |
Publication series
| Name | Proceedings of SPIE |
|---|---|
| Volume | 5289 |
| ISSN (Print) | 0277-786X |
Conference
| Conference | conference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21 |
|---|---|
| Period | 19/01/04 → 21/04/04 |
| Other | Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21 |
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Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. / Kjellander, B.K.C.; IJzendoorn, van, L.J.; Jong, de, A.M.; Broer, D.J.; Gennip, van, W.J.H.; Voigt, de, M.J.A.; Niemantsverdriet, J.W.
Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. ed. / L.-C. Chien; M.H. Wu. Bellingham, USA : SPIE, 2004. p. 94-101 (Proceedings of SPIE; Vol. 5289).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry
AU - Kjellander, B.K.C.
AU - IJzendoorn, van, L.J.
AU - Jong, de, A.M.
AU - Broer, D.J.
AU - Gennip, van, W.J.H.
AU - Voigt, de, M.J.A.
AU - Niemantsverdriet, J.W.
PY - 2004
Y1 - 2004
N2 - Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating
AB - Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating
U2 - 10.1117/12.526549
DO - 10.1117/12.526549
M3 - Conference contribution
SN - 0-8194-5192-4
T3 - Proceedings of SPIE
SP - 94
EP - 101
BT - Liquid Crystal Materials, Devices, and Applications X and Projection Displays X
A2 - Chien, L.-C.
A2 - Wu, M.H.
PB - SPIE
CY - Bellingham, USA
ER -