Tomographic imaging ultra-thick specimens with nanometer resolution

E. Sourty, B. Freitag, D. Wall, D. Tang, K. Lu, J. Loos

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)


Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Original languageEnglish
Pages (from-to)1056-1057
Number of pages2
JournalMicroscopy and Microanalysis
Issue number2
Publication statusPublished - 2008


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