| Original language | Dutch |
|---|---|
| Place of Publication | Eindhoven |
| Publisher | Technische Hogeschool Eindhoven |
| Number of pages | 35 |
| Publication status | Published - 1982 |
Publication series
| Name | DCT rapporten |
|---|---|
| Volume | 1982.018 |
Toevallige afwijkingen bij het meten van eigenschappen van random signalen
J.G.A.M. van Heck
Research output: Book/Report › Report › Popular
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