Toevallige afwijkingen bij het meten van eigenschappen van random signalen

J.G.A.M. van Heck

Research output: Book/ReportReportPopular

218 Downloads (Pure)
Original languageDutch
Place of PublicationEindhoven
PublisherTechnische Hogeschool Eindhoven
Number of pages35
Publication statusPublished - 1982

Publication series

NameDCT rapporten
Volume1982.018

Bibliographical note

WE 1982.018

Cite this