Abstract
Identifying and characterizing the structural integrity of single-walled carbon nanotubes (SWCNTs) that are fully embedded in a polymer matrix without causing any damage to them is a difficult task to achieve for bulk samples. Using tip-enhanced Raman spectroscopy, the surface of a polymer-embedded conductive network of SWCNTs was mapped underneath a thin layer of pure polymer. The technique was also used to detect tube-breaking within the composite sample caused by mechanical stress, beyond the 'visual' capabilities of scanning electron microscopy techniques. Results show that tip-enhanced Raman mapping can be used to successfully identify and characterize SWCNTs even underneath a layer of polymer.
Original language | English |
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Pages (from-to) | 191-196 |
Number of pages | 6 |
Journal | Journal of Raman Spectroscopy |
Volume | 48 |
Issue number | 2 |
Early online date | 11 Jul 2016 |
DOIs | |
Publication status | Published - 2 Feb 2017 |
Keywords
- Conductive composites
- Epoxy/amine systems
- Single-walled carbon nanotubes (SWCNTs)
- Tip-enhanced Raman mapping (TERM)
- Tip-enhanced Raman spectroscopy (TERS)