Abstract
Identifying and characterizing the structural integrity of single-walled carbon nanotubes (SWCNTs) that are fully embedded in a polymer matrix without causing any damage to them is a difficult task to achieve for bulk samples. Using tip-enhanced Raman spectroscopy, the surface of a polymer-embedded conductive network of SWCNTs was mapped underneath a thin layer of pure polymer. The technique was also used to detect tube-breaking within the composite sample caused by mechanical stress, beyond the 'visual' capabilities of scanning electron microscopy techniques. Results show that tip-enhanced Raman mapping can be used to successfully identify and characterize SWCNTs even underneath a layer of polymer.
| Original language | English |
|---|---|
| Pages (from-to) | 191-196 |
| Journal | Journal of Raman Spectroscopy |
| Volume | 48 |
| Issue number | 2 |
| Early online date | 11 Jul 2016 |
| DOIs | |
| Publication status | Published - 2 Feb 2017 |
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Keywords
- Conductive composites
- Epoxy/amine systems
- Single-walled carbon nanotubes (SWCNTs)
- Tip-enhanced Raman mapping (TERM)
- Tip-enhanced Raman spectroscopy (TERS)
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Tip-enhanced Raman mapping of single-walled carbon nanotube networks in conductive composite materials. / Hoffmann, G.G.; Bârsan, O.A.; van der Ven, L.G.J.; de With, G.
In: Journal of Raman Spectroscopy, Vol. 48, No. 2, 02.02.2017, p. 191-196.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - Tip-enhanced Raman mapping of single-walled carbon nanotube networks in conductive composite materials
AU - Hoffmann, G.G.
AU - Bârsan, O.A.
AU - van der Ven, L.G.J.
AU - de With, G.
PY - 2017/2/2
Y1 - 2017/2/2
N2 - Identifying and characterizing the structural integrity of single-walled carbon nanotubes (SWCNTs) that are fully embedded in a polymer matrix without causing any damage to them is a difficult task to achieve for bulk samples. Using tip-enhanced Raman spectroscopy, the surface of a polymer-embedded conductive network of SWCNTs was mapped underneath a thin layer of pure polymer. The technique was also used to detect tube-breaking within the composite sample caused by mechanical stress, beyond the 'visual' capabilities of scanning electron microscopy techniques. Results show that tip-enhanced Raman mapping can be used to successfully identify and characterize SWCNTs even underneath a layer of polymer.
AB - Identifying and characterizing the structural integrity of single-walled carbon nanotubes (SWCNTs) that are fully embedded in a polymer matrix without causing any damage to them is a difficult task to achieve for bulk samples. Using tip-enhanced Raman spectroscopy, the surface of a polymer-embedded conductive network of SWCNTs was mapped underneath a thin layer of pure polymer. The technique was also used to detect tube-breaking within the composite sample caused by mechanical stress, beyond the 'visual' capabilities of scanning electron microscopy techniques. Results show that tip-enhanced Raman mapping can be used to successfully identify and characterize SWCNTs even underneath a layer of polymer.
KW - Conductive composites
KW - Epoxy/amine systems
KW - Single-walled carbon nanotubes (SWCNTs)
KW - Tip-enhanced Raman mapping (TERM)
KW - Tip-enhanced Raman spectroscopy (TERS)
UR - http://www.scopus.com/inward/record.url?scp=84979774536&partnerID=8YFLogxK
U2 - 10.1002/jrs.5004
DO - 10.1002/jrs.5004
M3 - Article
AN - SCOPUS:84979774536
VL - 48
SP - 191
EP - 196
JO - Journal of Raman Spectroscopy
JF - Journal of Raman Spectroscopy
SN - 0377-0486
IS - 2
ER -