Tip-enhanced Raman mapping of single-walled carbon nanotube networks in conductive composite materials

G.G. Hoffmann, O.A. Bârsan, L.G.J. van der Ven, G. de With

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
1 Downloads (Pure)

Abstract

Identifying and characterizing the structural integrity of single-walled carbon nanotubes (SWCNTs) that are fully embedded in a polymer matrix without causing any damage to them is a difficult task to achieve for bulk samples. Using tip-enhanced Raman spectroscopy, the surface of a polymer-embedded conductive network of SWCNTs was mapped underneath a thin layer of pure polymer. The technique was also used to detect tube-breaking within the composite sample caused by mechanical stress, beyond the 'visual' capabilities of scanning electron microscopy techniques. Results show that tip-enhanced Raman mapping can be used to successfully identify and characterize SWCNTs even underneath a layer of polymer.

Original languageEnglish
Pages (from-to)191-196
Number of pages6
JournalJournal of Raman Spectroscopy
Volume48
Issue number2
Early online date11 Jul 2016
DOIs
Publication statusPublished - 2 Feb 2017

Keywords

  • Conductive composites
  • Epoxy/amine systems
  • Single-walled carbon nanotubes (SWCNTs)
  • Tip-enhanced Raman mapping (TERM)
  • Tip-enhanced Raman spectroscopy (TERS)

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