Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2

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Abstract

Terahertz spectroscopy is a powerful and contactless technique that enables to measure charge carrier properties in metals and semiconductors. However, the relatively long wavelengths of THz radiation and the diffraction limit imposed by optical imaging systems, reduces the applicability of THz spectroscopy considerably. We have developed a time-resolved terahertz near-field microscope that allows measurements of the carrier dynamics with sub-diffraction resolution. This microscope is used to measure an exfoliated flake of a 2D transition metal dichalcogenide crystal with a few tens of microns' resolution. Mapping carrier dynamics of semiconductors, non-invasively, and on micron length scales, opens new possibilities for material characterization.

Original languageEnglish
Title of host publication2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
PublisherIEEE Computer Society
Pages478-479
Number of pages2
ISBN (Electronic)9781728166209
DOIs
Publication statusPublished - 8 Nov 2020
Event45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States
Duration: 8 Nov 202013 Nov 2020
Conference number: 45

Conference

Conference45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Abbreviated titleIRMMW-THz
Country/TerritoryUnited States
CityVirtual, Buffalo
Period8/11/2013/11/20

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