Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2

Stan Ter Huurne; Niels Van Hoof; Sara Elrafey; Alberto Curto; Jaime Gomez-Rivas

doi:10.1109/IRMMW-THz46771.2020.9370412

Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2

Stan Ter Huurne, Niels Van Hoof, Sara Elrafey, Alberto Curto, Jaime Gomez-Rivas

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Terahertz spectroscopy is a powerful and contactless technique that enables to measure charge carrier properties in metals and semiconductors. However, the relatively long wavelengths of THz radiation and the diffraction limit imposed by optical imaging systems, reduces the applicability of THz spectroscopy considerably. We have developed a time-resolved terahertz near-field microscope that allows measurements of the carrier dynamics with sub-diffraction resolution. This microscope is used to measure an exfoliated flake of a 2D transition metal dichalcogenide crystal with a few tens of microns' resolution. Mapping carrier dynamics of semiconductors, non-invasively, and on micron length scales, opens new possibilities for material characterization.

Original language	English
Title of host publication	2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Publisher	IEEE Computer Society
Pages	478-479
Number of pages	2
ISBN (Electronic)	9781728166209
DOIs	https://doi.org/10.1109/IRMMW-THz46771.2020.9370412
Publication status	Published - 8 Nov 2020
Event	45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States Duration: 8 Nov 2020 → 13 Nov 2020 Conference number: 45

Conference

Conference	45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Abbreviated title	IRMMW-THz
Country/Territory	United States
City	Virtual, Buffalo
Period	8/11/20 → 13/11/20

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10.1109/IRMMW-THz46771.2020.9370412

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title = "Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2",

abstract = "Terahertz spectroscopy is a powerful and contactless technique that enables to measure charge carrier properties in metals and semiconductors. However, the relatively long wavelengths of THz radiation and the diffraction limit imposed by optical imaging systems, reduces the applicability of THz spectroscopy considerably. We have developed a time-resolved terahertz near-field microscope that allows measurements of the carrier dynamics with sub-diffraction resolution. This microscope is used to measure an exfoliated flake of a 2D transition metal dichalcogenide crystal with a few tens of microns' resolution. Mapping carrier dynamics of semiconductors, non-invasively, and on micron length scales, opens new possibilities for material characterization.",

author = "Huurne, {Stan Ter} and {Van Hoof}, Niels and Sara Elrafey and Alberto Curto and Jaime Gomez-Rivas",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.; 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020, IRMMW-THz ; Conference date: 08-11-2020 Through 13-11-2020",

year = "2020",

month = nov,

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doi = "10.1109/IRMMW-THz46771.2020.9370412",

language = "English",

pages = "478--479",

booktitle = "2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)",

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Huurne, ST, Van Hoof, N, Elrafey, S, Curto, A & Gomez-Rivas, J 2020, Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2. in 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) ., 9370412, IEEE Computer Society, pp. 478-479, 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020, Virtual, Buffalo, New York, United States, 8/11/20. https://doi.org/10.1109/IRMMW-THz46771.2020.9370412

Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2. / Huurne, Stan Ter; Van Hoof, Niels; Elrafey, Sara et al.
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) . IEEE Computer Society, 2020. p. 478-479 9370412.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Huurne, Stan Ter

AU - Van Hoof, Niels

AU - Elrafey, Sara

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AU - Gomez-Rivas, Jaime

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N2 - Terahertz spectroscopy is a powerful and contactless technique that enables to measure charge carrier properties in metals and semiconductors. However, the relatively long wavelengths of THz radiation and the diffraction limit imposed by optical imaging systems, reduces the applicability of THz spectroscopy considerably. We have developed a time-resolved terahertz near-field microscope that allows measurements of the carrier dynamics with sub-diffraction resolution. This microscope is used to measure an exfoliated flake of a 2D transition metal dichalcogenide crystal with a few tens of microns' resolution. Mapping carrier dynamics of semiconductors, non-invasively, and on micron length scales, opens new possibilities for material characterization.

AB - Terahertz spectroscopy is a powerful and contactless technique that enables to measure charge carrier properties in metals and semiconductors. However, the relatively long wavelengths of THz radiation and the diffraction limit imposed by optical imaging systems, reduces the applicability of THz spectroscopy considerably. We have developed a time-resolved terahertz near-field microscope that allows measurements of the carrier dynamics with sub-diffraction resolution. This microscope is used to measure an exfoliated flake of a 2D transition metal dichalcogenide crystal with a few tens of microns' resolution. Mapping carrier dynamics of semiconductors, non-invasively, and on micron length scales, opens new possibilities for material characterization.

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BT - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

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Y2 - 8 November 2020 through 13 November 2020

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Time-resolved THz time-domain near-field microscopy of exfoliated single flakes of WS2

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