Time-resolved pinhole imaging and EUV spectroscopy on the Philips EUV hollow cathode discharge

E.R. Kieft, J.J.A.M. Mullen, van der, V.Y. Banine, G.M.W. Kroesen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationJoint Conference ESCAM PIG 16. Sixteenth European Conference on Atomic and Molecular Physics of Ionized Gases. ICRP 5 Fifth International Conference on Reactive Plasma. Conference Proceedings
Place of PublicationGrenoble, France
PublisherUniv. Joseph Fourier
Publication statusPublished - 2002

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