THz transient photoconductivity with near-field detection

N.J.J. van Hoof; S.E.T. ter Huurne; J. Gomez Rivas; A. Halpin

doi:10.1109/IRMMW-THz.2018.8510369

THz transient photoconductivity with near-field detection

N.J.J. van Hoof
, S.E.T. ter Huurne
, J. Gomez Rivas
, A. Halpin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We demonstrate a novel technique that enables the sub-diffraction near-field study of photo-excited structures probed with broadband THz radiation. As a proof-of-concept this system measures sub-ps temporal dynamics of photoexcited carriers in a thin film of GaAs with a spatial resolution of 60 μm (λ/10 at 0.5 THz peak intensity).

Original language	English
Title of host publication	2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Number of pages	2
ISBN (Electronic)	978-1-5386-3809-5
ISBN (Print)	978-1-5386-3810-1
DOIs	https://doi.org/10.1109/IRMMW-THz.2018.8510369
Publication status	Published - 25 Oct 2018
Event	43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018 - Nagoya, Japan Duration: 9 Sept 2018 → 14 Sept 2018 Conference number: 43

Conference

Conference	43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018
Abbreviated title	IRMMW-THz
Country/Territory	Japan
City	Nagoya
Period	9/09/18 → 14/09/18

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10.1109/IRMMW-THz.2018.8510369

Cite this

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title = "THz transient photoconductivity with near-field detection",

abstract = "We demonstrate a novel technique that enables the sub-diffraction near-field study of photo-excited structures probed with broadband THz radiation. As a proof-of-concept this system measures sub-ps temporal dynamics of photoexcited carriers in a thin film of GaAs with a spatial resolution of 60 μm (λ/10 at 0.5 THz peak intensity).",

author = "\{van Hoof\}, N.J.J. and \{ter Huurne\}, S.E.T. and Rivas, \{J. Gomez\} and A. Halpin",

year = "2018",

month = oct,

day = "25",

doi = "10.1109/IRMMW-THz.2018.8510369",

language = "English",

isbn = "978-1-5386-3810-1",

booktitle = "2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018, IRMMW-THz ; Conference date: 09-09-2018 Through 14-09-2018",

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van Hoof, NJJ, ter Huurne, SET, Rivas, JG & Halpin, A 2018, THz transient photoconductivity with near-field detection. in 2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018., 8510369, Institute of Electrical and Electronics Engineers, Piscataway, 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018, Nagoya, Japan, 9/09/18. https://doi.org/10.1109/IRMMW-THz.2018.8510369

THz transient photoconductivity with near-field detection. / van Hoof, N.J.J.; ter Huurne, S.E.T.; Rivas, J. Gomez et al.
2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018. Piscataway: Institute of Electrical and Electronics Engineers, 2018. 8510369.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - THz transient photoconductivity with near-field detection

AU - van Hoof, N.J.J.

AU - ter Huurne, S.E.T.

AU - Rivas, J. Gomez

AU - Halpin, A.

N1 - Conference code: 43

PY - 2018/10/25

Y1 - 2018/10/25

N2 - We demonstrate a novel technique that enables the sub-diffraction near-field study of photo-excited structures probed with broadband THz radiation. As a proof-of-concept this system measures sub-ps temporal dynamics of photoexcited carriers in a thin film of GaAs with a spatial resolution of 60 μm (λ/10 at 0.5 THz peak intensity).

AB - We demonstrate a novel technique that enables the sub-diffraction near-field study of photo-excited structures probed with broadband THz radiation. As a proof-of-concept this system measures sub-ps temporal dynamics of photoexcited carriers in a thin film of GaAs with a spatial resolution of 60 μm (λ/10 at 0.5 THz peak intensity).

UR - https://www.scopus.com/pages/publications/85056834895

U2 - 10.1109/IRMMW-THz.2018.8510369

DO - 10.1109/IRMMW-THz.2018.8510369

M3 - Conference contribution

SN - 978-1-5386-3810-1

BT - 2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018

Y2 - 9 September 2018 through 14 September 2018

ER -

THz transient photoconductivity with near-field detection

Abstract

Conference

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