Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's

Reinout Woltjer, Gel M. Paulzen, Henk G. Pomp, Herbert Lifka, Pierre H. Woerlee

Research output: Contribution to journalArticleAcademicpeer-review

83 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's'. Together they form a unique fingerprint.

Engineering

Material Science