Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

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@article{9b33a94e93aa4fd390d42dc86865b39c,

title = "Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS",

author = "P.L.J. Gunter and J.W. Niemantsverdriet",

year = "1995",

doi = "10.1016/0169-4332(95)00014-3",

language = "English",

volume = "89",

pages = "69--76",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "1",

}