Thickness determination of uniform overlayers on rough substrates: A comparison of calculations for Al2O3/Al to x-ray photoelectron spectroscopy and atomic force microscopy experiments on technical aluminium foils

P.L.J. Gunter, J.W. Niemantsverdriet

Research output: Contribution to journalArticleAcademicpeer-review

17 Citations (Scopus)
65 Downloads (Pure)
Original languageEnglish
Pages (from-to)1290-1293
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
Volume13
Issue number3
DOIs
Publication statusPublished - 1995

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