Abstract
This paper presents a summary of the modeling andtechnology developed for flexible and stretchableelectronics. The integration of ultra thin dies at package level, with thickness in the range of 20 to 30 μm, into flexible and/or stretchable materials are demonstrated as well as the design and reliability test of stretchable metal interconnections at board level are analyzed by both experiments and finite element modeling. These technologies can achieve mechanically bendable and stretchable subsystems.The base substrate used for the fabrication of flexiblecircuits is a uniform polyimide layer, while siliconesmaterials are preferred for the stretchable circuits. The method developed for chip embedding andinterconnections is named Ultra Thin Chip Package(UTCP). Extensions of this technology can be achievedby stacking and embedding thin dies in polyimide,providing large benefits in electrical performance and still allowing some mechanical flexibility. These flexible circuits can be converted into stretchable circuits by replacing the relatively rigid polyimide by a soft and elastic silicone material. We have shown through finite element modeling and experimental validation that an appropriate thermo mechanical design is necessary to achieve mechanically reliable circuits and thermally optimized packages.
Original language | English |
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Title of host publication | Proceedings of the 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2010), |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Number of pages | 7 |
ISBN (Electronic) | 978-1-4244-7027-3 |
ISBN (Print) | 978-1-4244-7026-6 |
DOIs | |
Publication status | Published - 2010 |
Externally published | Yes |
Event | International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE) - Bordeaux, France Duration: 26 Apr 2010 → 28 Apr 2010 |
Conference
Conference | International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE) |
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Country/Territory | France |
City | Bordeaux |
Period | 26/04/10 → 28/04/10 |