Theoretical and experimental studies of off-the-shelf V-dot probes

Bucur M. Novac, Renzhen Xiao, Tom Huiskamp, Laurent Pecastaing, Meng Wang, Peter Senior, Antoine Silvestre de Ferron, A.J.M. Pemen, Marc Rivaletto

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

Original languageEnglish
Article number8419077
Pages (from-to)2985 - 2992
Number of pages8
JournalIEEE Transactions on Plasma Science
Volume46
Issue number8
DOIs
Publication statusPublished - 24 Jul 2018
Event21st IEEE Pulsed Power Conference (PPC 2017), June 18-22, 2017, Brighton, UK - Hilton Metropole, Brighton, United Kingdom
Duration: 18 Jun 201722 Jun 2017
http://ece-events.unm.edu/ppc2017/

Fingerprint

shelves
impulses
probes
electric potential
closing
transmission lines
generators
switches
pulses

Keywords

  • Connectors
  • Microwave FET integrated circuits
  • Microwave integrated circuits
  • Probes
  • Pulse forming lines (PFLs)
  • pulsed-power systems
  • Spark gaps
  • Transmission line measurements
  • Voltage measurement
  • voltage probes.

Cite this

Novac, B. M., Xiao, R., Huiskamp, T., Pecastaing, L., Wang, M., Senior, P., ... Rivaletto, M. (2018). Theoretical and experimental studies of off-the-shelf V-dot probes. IEEE Transactions on Plasma Science, 46(8), 2985 - 2992. [8419077]. https://doi.org/10.1109/TPS.2018.2854971
Novac, Bucur M. ; Xiao, Renzhen ; Huiskamp, Tom ; Pecastaing, Laurent ; Wang, Meng ; Senior, Peter ; de Ferron, Antoine Silvestre ; Pemen, A.J.M. ; Rivaletto, Marc. / Theoretical and experimental studies of off-the-shelf V-dot probes. In: IEEE Transactions on Plasma Science. 2018 ; Vol. 46, No. 8. pp. 2985 - 2992.
@article{ac1f0d430b9843908fd2ef56c6fd0b9e,
title = "Theoretical and experimental studies of off-the-shelf V-dot probes",
abstract = "This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.",
keywords = "Connectors, Microwave FET integrated circuits, Microwave integrated circuits, Probes, Pulse forming lines (PFLs), pulsed-power systems, Spark gaps, Transmission line measurements, Voltage measurement, voltage probes.",
author = "Novac, {Bucur M.} and Renzhen Xiao and Tom Huiskamp and Laurent Pecastaing and Meng Wang and Peter Senior and {de Ferron}, {Antoine Silvestre} and A.J.M. Pemen and Marc Rivaletto",
year = "2018",
month = "7",
day = "24",
doi = "10.1109/TPS.2018.2854971",
language = "English",
volume = "46",
pages = "2985 -- 2992",
journal = "IEEE Transactions on Plasma Science",
issn = "0093-3813",
publisher = "Institute of Electrical and Electronics Engineers",
number = "8",

}

Novac, BM, Xiao, R, Huiskamp, T, Pecastaing, L, Wang, M, Senior, P, de Ferron, AS, Pemen, AJM & Rivaletto, M 2018, 'Theoretical and experimental studies of off-the-shelf V-dot probes', IEEE Transactions on Plasma Science, vol. 46, no. 8, 8419077, pp. 2985 - 2992. https://doi.org/10.1109/TPS.2018.2854971

Theoretical and experimental studies of off-the-shelf V-dot probes. / Novac, Bucur M.; Xiao, Renzhen; Huiskamp, Tom; Pecastaing, Laurent; Wang, Meng; Senior, Peter; de Ferron, Antoine Silvestre; Pemen, A.J.M.; Rivaletto, Marc.

In: IEEE Transactions on Plasma Science, Vol. 46, No. 8, 8419077, 24.07.2018, p. 2985 - 2992.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Theoretical and experimental studies of off-the-shelf V-dot probes

AU - Novac, Bucur M.

AU - Xiao, Renzhen

AU - Huiskamp, Tom

AU - Pecastaing, Laurent

AU - Wang, Meng

AU - Senior, Peter

AU - de Ferron, Antoine Silvestre

AU - Pemen, A.J.M.

AU - Rivaletto, Marc

PY - 2018/7/24

Y1 - 2018/7/24

N2 - This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

AB - This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

KW - Connectors

KW - Microwave FET integrated circuits

KW - Microwave integrated circuits

KW - Probes

KW - Pulse forming lines (PFLs)

KW - pulsed-power systems

KW - Spark gaps

KW - Transmission line measurements

KW - Voltage measurement

KW - voltage probes.

UR - http://www.scopus.com/inward/record.url?scp=85050595522&partnerID=8YFLogxK

U2 - 10.1109/TPS.2018.2854971

DO - 10.1109/TPS.2018.2854971

M3 - Article

AN - SCOPUS:85050595522

VL - 46

SP - 2985

EP - 2992

JO - IEEE Transactions on Plasma Science

JF - IEEE Transactions on Plasma Science

SN - 0093-3813

IS - 8

M1 - 8419077

ER -