Theoretical and experimental studies of off-the-shelf V-dot probes

Bucur M. Novac, Renzhen Xiao, Tom Huiskamp, Laurent Pecastaing, Meng Wang, Peter Senior, Antoine Silvestre de Ferron, A.J.M. Pemen, Marc Rivaletto

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Abstract

This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

Original languageEnglish
Article number8419077
Pages (from-to)2985 - 2992
Number of pages8
JournalIEEE Transactions on Plasma Science
Volume46
Issue number8
DOIs
Publication statusPublished - Aug 2018
Event21st IEEE Pulsed Power Conference (PPC 2017), June 18-22, 2017, Brighton, UK - Hilton Metropole, Brighton, United Kingdom
Duration: 18 Jun 201722 Jun 2017
http://ece-events.unm.edu/ppc2017/

Keywords

  • Connectors
  • Microwave FET integrated circuits
  • Microwave integrated circuits
  • Probes
  • Pulse forming lines (PFLs)
  • pulsed-power systems
  • Spark gaps
  • Transmission line measurements
  • Voltage measurement
  • voltage probes.
  • voltage probes

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    Novac, B. M., Xiao, R., Huiskamp, T., Pecastaing, L., Wang, M., Senior, P., ... Rivaletto, M. (2018). Theoretical and experimental studies of off-the-shelf V-dot probes. IEEE Transactions on Plasma Science, 46(8), 2985 - 2992. [8419077]. https://doi.org/10.1109/TPS.2018.2854971