This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.
|Pages (from-to)||2985 - 2992|
|Number of pages||8|
|Journal||IEEE Transactions on Plasma Science|
|Publication status||Published - Aug 2018|
|Event||21st IEEE Pulsed Power Conference (PPC 2017), June 18-22, 2017, Brighton, UK - Hilton Metropole, Brighton, United Kingdom|
Duration: 18 Jun 2017 → 22 Jun 2017
- Microwave FET integrated circuits
- Microwave integrated circuits
- Pulse forming lines (PFLs)
- pulsed-power systems
- Spark gaps
- Transmission line measurements
- Voltage measurement
- voltage probes.
- voltage probes