Theoretical and experimental studies of off-the-shelf V-dot probes

Bucur M. Novac; Renzhen Xiao; Tom Huiskamp; Laurent Pecastaing; Meng Wang; Peter Senior; Antoine Silvestre de Ferron; A.J.M. Pemen; Marc Rivaletto

doi:10.1109/TPS.2018.2854971

Theoretical and experimental studies of off-the-shelf V-dot probes

Bucur M. Novac, Renzhen Xiao, Tom Huiskamp, Laurent Pecastaing, Meng Wang, Peter Senior, Antoine Silvestre de Ferron, A.J.M. Pemen, Marc Rivaletto

Research output: Contribution to journal › Article › Academic › peer-review

12 Citations (Scopus)

Abstract

This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

Original language	English
Article number	8419077
Pages (from-to)	2985 - 2992
Number of pages	8
Journal	IEEE Transactions on Plasma Science
Volume	46
Issue number	8
DOIs	https://doi.org/10.1109/TPS.2018.2854971
Publication status	Published - Aug 2018
Event	21st IEEE International Conference Pulsed Power, PPC 2017 - Hilton Metropole, Brighton, United Kingdom Duration: 18 Jun 2017 → 22 Jun 2017 Conference number: 21 http://ece-events.unm.edu/ppc2017/

Keywords

Connectors
Microwave FET integrated circuits
Microwave integrated circuits
Probes
Pulse forming lines (PFLs)
pulsed-power systems
Spark gaps
Transmission line measurements
Voltage measurement
voltage probes.
voltage probes

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10.1109/TPS.2018.2854971

Cite this

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title = "Theoretical and experimental studies of off-the-shelf V-dot probes",

abstract = "This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.",

keywords = "Connectors, Microwave FET integrated circuits, Microwave integrated circuits, Probes, Pulse forming lines (PFLs), pulsed-power systems, Spark gaps, Transmission line measurements, Voltage measurement, voltage probes., voltage probes",

author = "Novac, {Bucur M.} and Renzhen Xiao and Tom Huiskamp and Laurent Pecastaing and Meng Wang and Peter Senior and {de Ferron}, {Antoine Silvestre} and A.J.M. Pemen and Marc Rivaletto",

year = "2018",

month = aug,

doi = "10.1109/TPS.2018.2854971",

language = "English",

volume = "46",

pages = "2985 -- 2992",

journal = "IEEE Transactions on Plasma Science",

issn = "0093-3813",

publisher = "Institute of Electrical and Electronics Engineers",

number = "8",

note = "21st IEEE International Conference Pulsed Power, PPC 2017, PPC 2017 ; Conference date: 18-06-2017 Through 22-06-2017",

url = "http://ece-events.unm.edu/ppc2017/",

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AU - Novac, Bucur M.

AU - Xiao, Renzhen

AU - Huiskamp, Tom

AU - Pecastaing, Laurent

AU - Wang, Meng

AU - Senior, Peter

AU - de Ferron, Antoine Silvestre

AU - Pemen, A.J.M.

AU - Rivaletto, Marc

N1 - Conference code: 21

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KW - Connectors

KW - Microwave FET integrated circuits

KW - Microwave integrated circuits

KW - Probes

KW - Pulse forming lines (PFLs)

KW - pulsed-power systems

KW - Spark gaps

KW - Transmission line measurements

KW - Voltage measurement

KW - voltage probes.

KW - voltage probes

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DO - 10.1109/TPS.2018.2854971

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JF - IEEE Transactions on Plasma Science

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T2 - 21st IEEE International Conference Pulsed Power, PPC 2017

Y2 - 18 June 2017 through 22 June 2017

ER -

Theoretical and experimental studies of off-the-shelf V-dot probes

Abstract

Keywords

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