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The temperature dependence of 1/f noise in InP

  • X.Y. Chen
  • , F.N. Hooge
  • , M.R. Leijs

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

Noise spectra were measured on CBE grown InP samples in the frequency range from 1 Hz to 104 kHz at temperatures from 77 to 500 K. The experimental results show that llfnoise stems from the lattice scattering. The 1/f noise in InP is well characterised by a parameter CtL~,, in this temperature range. The temperature dependence of ~tLat, was determined experimentally. Assuming that the number of phonons in a mode fluctuates with a 1/f spectrum, we are able to derive a theoretical expression for ~Latt in terms of the contributions by the acoustic phonons and the polar optical phonons. At low temperatures ( <200 K), the temperature dependence of OtL~,, can be analysed by this model with two kinds of phonons. However, at temperatures above 200 K, the model does not lead to satisfactory results
Original languageEnglish
Pages (from-to)1269-1275
Number of pages7
JournalSolid-State Electronics
Volume41
Issue number9
DOIs
Publication statusPublished - 1997

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