Abstract
Noise spectra were measured on CBE grown InP samples in the frequency range from 1 Hz to 104 kHz at temperatures from 77 to 500 K. The experimental results show that llfnoise stems from the lattice scattering. The 1/f noise in InP is well characterised by a parameter CtL~,, in this temperature range. The temperature dependence of ~tLat, was determined experimentally. Assuming that the number of phonons in a mode fluctuates with a 1/f spectrum, we are able to derive a theoretical expression for
~Latt in terms of the contributions by the acoustic phonons and the polar optical phonons. At low temperatures ( <200 K), the temperature dependence of OtL~,, can be analysed by this model with two kinds of phonons. However, at temperatures above 200 K, the model does not lead to satisfactory results
| Original language | English |
|---|---|
| Pages (from-to) | 1269-1275 |
| Number of pages | 7 |
| Journal | Solid-State Electronics |
| Volume | 41 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1997 |
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