The STM as a tool to measure the potential distribution inside soft organic semiconductors

M. Kemerink, P. Offermans, J.K.J. Duren, van, R.A.J. Janssen, P.M. Koenraad, H.W.M. Salemink, J.H. Wolter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada
Pages	106-
Publication status	Published - 2001
Event	conference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques - Duration: 1 Jan 2001 → …

Conference	conference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques
Period	1/01/01 → …
Other	11th Int. Conf. on STM/Spectroscopy and Related Techniques

Cite this

@inproceedings{43e89b0988874c2bba67b8e4e1ba6408,

title = "The STM as a tool to measure the potential distribution inside soft organic semiconductors",

author = "M. Kemerink and P. Offermans and {Duren, van}, J.K.J. and R.A.J. Janssen and P.M. Koenraad and H.W.M. Salemink and J.H. Wolter",

year = "2001",

language = "English",

pages = "106--",

booktitle = "11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada",

note = "conference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques ; Conference date: 01-01-2001",

}

Kemerink, M, Offermans, P, Duren, van, JKJ, Janssen, RAJ , Koenraad, PM, Salemink, HWM & Wolter, JH 2001, The STM as a tool to measure the potential distribution inside soft organic semiconductors. in 11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada. pp. 106-, conference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques, 1/01/01.

The STM as a tool to measure the potential distribution inside soft organic semiconductors. / Kemerink, M.; Offermans, P.; Duren, van, J.K.J. et al.
11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada. 2001. p. 106-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - The STM as a tool to measure the potential distribution inside soft organic semiconductors

AU - Kemerink, M.

AU - Offermans, P.

AU - Duren, van, J.K.J.

AU - Janssen, R.A.J.

AU - Koenraad, P.M.

AU - Salemink, H.W.M.

AU - Wolter, J.H.

PY - 2001

Y1 - 2001

M3 - Conference contribution

SP - 106-

BT - 11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada

T2 - conference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques

Y2 - 1 January 2001

ER -