The scaling limits of the non critical strip wetting model

J. Sohier

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Abstract

The strip wetting model is defined by giving a (continuous space) one dimensional random walk S a reward ß each time it hits the strip R+×[0,a] (where a is a positive parameter), which plays the role of a defect line. We show that this model exhibits a phase transition between a delocalized regime (ßßca), where the critical point ßca>0 depends on S and on a. In this paper we give a precise pathwise description of the transition, extracting the full scaling limits of the model. Our approach is based on Markov renewal theory. Keywords: Fluctuation theory for random walks; Markov renewal theory; Scaling limits for physical systems
Original languageEnglish
Pages (from-to)3075-3103
Number of pages29
JournalStochastic Processes and their Applications
Volume125
Issue number8
DOIs
Publication statusPublished - 2015

Fingerprint Dive into the research topics of 'The scaling limits of the non critical strip wetting model'. Together they form a unique fingerprint.

Cite this