The role of test protocols in testing embedded-core-based system ICs

Erik Jan Marinissen; Maurice Lousberg

doi:10.1109/ETW.1999.804248

The role of test protocols in testing embedded-core-based system ICs

Erik Jan Marinissen
, Maurice Lousberg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

26 Citations (Scopus)

Abstract

A core-based design style introduces new test challenges, which, if not dealt with properly, might defeat the entire purpose of using pre-designed cores. Macro Test is a liberal test approach for core-based designs, i.e., it supports all kinds of test access mechanisms to the embedded cores. The separation of tests into test protocols and test patterns plays a crucial role in Macro Test. Tasks as expansion of core-level tests to chip level, scheduling of tests, and test assembly are carried out on test protocols by software tools. This paper addresses the role of test protocols and features an example of a small scan-Testable core. We argue that the fact that expansion and scheduling take place on test protocols rather than on complete tests is important to reduce the computational complexity of the associated software tools.

Original language	English
Title of host publication	Proceedings - European Test Workshop 1999, ETW 1999
Publisher	Institute of Electrical and Electronics Engineers
Pages	70-75
Number of pages	6
ISBN (Electronic)	076950390X, 9780769503905
DOIs	https://doi.org/10.1109/ETW.1999.804248
Publication status	Published - 1 Jan 1999
Externally published	Yes
Event	1999 IEEE European Test Workshop, ETW 1999 - Constance, Germany Duration: 25 May 1999 → 28 May 1999

Conference

Conference	1999 IEEE European Test Workshop, ETW 1999
Abbreviated title	ETW 1999
Country/Territory	Germany
City	Constance
Period	25/05/99 → 28/05/99

Funding

We would like to acknowledge the cooperation and comments of our colleagues Emile Aarts, Krijn Kuiper, Paul Merkus, and Clemens Wouters. The M.Sc. students Joep Aerts, Marcel Boosten, Harro Jacobs, Micle Moerenhout, and Michael van Wijngaarden (Department of Mathematics and Computing Science, Eindhoven University of Technology) have all contributed to this work through their respective graduation projects, carried out at Philips Research. This work was supported by Philips Semiconductors, and partly funded by Esprit 2318 (Everest), Jessi AC6, and Medea A403-2.2.

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10.1109/ETW.1999.804248

Cite this

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title = "The role of test protocols in testing embedded-core-based system ICs",

abstract = "A core-based design style introduces new test challenges, which, if not dealt with properly, might defeat the entire purpose of using pre-designed cores. Macro Test is a liberal test approach for core-based designs, i.e., it supports all kinds of test access mechanisms to the embedded cores. The separation of tests into test protocols and test patterns plays a crucial role in Macro Test. Tasks as expansion of core-level tests to chip level, scheduling of tests, and test assembly are carried out on test protocols by software tools. This paper addresses the role of test protocols and features an example of a small scan-Testable core. We argue that the fact that expansion and scheduling take place on test protocols rather than on complete tests is important to reduce the computational complexity of the associated software tools.",

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AB - A core-based design style introduces new test challenges, which, if not dealt with properly, might defeat the entire purpose of using pre-designed cores. Macro Test is a liberal test approach for core-based designs, i.e., it supports all kinds of test access mechanisms to the embedded cores. The separation of tests into test protocols and test patterns plays a crucial role in Macro Test. Tasks as expansion of core-level tests to chip level, scheduling of tests, and test assembly are carried out on test protocols by software tools. This paper addresses the role of test protocols and features an example of a small scan-Testable core. We argue that the fact that expansion and scheduling take place on test protocols rather than on complete tests is important to reduce the computational complexity of the associated software tools.

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M3 - Conference contribution

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The role of test protocols in testing embedded-core-based system ICs

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