Abstract
pn-Junctions in IC processes are investigated for the use as an inductive design component. Measurements of inductance, quality factor and noise under avalanche breakdown conditions are compared to device simulations and the theory for IMPATT diodes. Inhomogeneous breakdown is also investigated.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of Bipolar/Bicmos Circuits and Technology Meeting |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 125-128 |
| Number of pages | 4 |
| ISBN (Print) | 0-7803-2778-0 |
| DOIs | |
| Publication status | Published - 6 Aug 2020 |
| Externally published | Yes |
| Event | 1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, United States Duration: 2 Oct 1995 → 3 Oct 1995 |
Conference
| Conference | 1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting |
|---|---|
| Country/Territory | United States |
| City | Minneapolis |
| Period | 2/10/95 → 3/10/95 |
Fingerprint
Dive into the research topics of 'The pn-Junction as an inductive design component in silicon IC processes'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver