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The pn-Junction as an inductive design component in silicon IC processes

  • G.A.M. Hurkx
  • , P.G.M. Baltus
  • , J.A.M. de Boet
  • , J.A.M. Geelen
  • , J.J.E.M. Hageraats

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

pn-Junctions in IC processes are investigated for the use as an inductive design component. Measurements of inductance, quality factor and noise under avalanche breakdown conditions are compared to device simulations and the theory for IMPATT diodes. Inhomogeneous breakdown is also investigated.

Original languageEnglish
Title of host publicationProceedings of Bipolar/Bicmos Circuits and Technology Meeting
PublisherInstitute of Electrical and Electronics Engineers
Pages125-128
Number of pages4
ISBN (Print)0-7803-2778-0
DOIs
Publication statusPublished - 6 Aug 2020
Externally publishedYes
Event1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, United States
Duration: 2 Oct 1995 → 3 Oct 1995

Conference

Conference1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Country/TerritoryUnited States
CityMinneapolis
Period2/10/95 → 3/10/95

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