The outermost layer of thin films of partially fluorinated polymethacrylates: A Low-Energy Ion Scattering (LEIS) study

R.D. van de Grampel, A.J.H. Maas, W.J.H. Gennip, van, W. Ming, M.J. Krupers, P.C. Thuene, J. Laven, J.W. Niemantsverdriet, H.H. Brongersma, R. Linde, van der

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationProceedings Fluoropolymers 2000 Conference
Place of PublicationSanannah GA
Publication statusPublished - 2000
Eventconference; Fluoropolymers 2000 Conference; 2000-07-01; 2000-07-01 -
Duration: 1 Jul 20001 Jul 2000

Conference

Conferenceconference; Fluoropolymers 2000 Conference; 2000-07-01; 2000-07-01
Period1/07/001/07/00
OtherFluoropolymers 2000 Conference

Cite this

van de Grampel, R. D., Maas, A. J. H., Gennip, van, W. J. H., Ming, W., Krupers, M. J., Thuene, P. C., ... Linde, van der, R. (2000). The outermost layer of thin films of partially fluorinated polymethacrylates: A Low-Energy Ion Scattering (LEIS) study. In Proceedings Fluoropolymers 2000 Conference Sanannah GA.