The mutual relation between patents and R&D

H. Ophem, van, E. Brouwer, A.H. Kleinknecht, P. Mohnen

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	English
Title of host publication	Innovation and firm performance : econometric explorations of survey data
Editors	A.H. Kleinknecht, P. Mohnen
Place of Publication	London
Publisher	Palgrave
Pages	56-70
ISBN (Print)	0-333-96109-9
DOIs	https://doi.org/10.1057/9780230595880_3
Publication status	Published - 2002

Access to Document

@inbook{88475a778f854b798132f2703e30f52b,

title = "The mutual relation between patents and R\&D",

author = "\{Ophem, van\}, H. and E. Brouwer and A.H. Kleinknecht and P. Mohnen",

year = "2002",

doi = "10.1057/9780230595880\_3",

language = "English",

isbn = "0-333-96109-9",

pages = "56--70",

editor = "A.H. Kleinknecht and P. Mohnen",

booktitle = "Innovation and firm performance : econometric explorations of survey data",

publisher = "Palgrave",

}

TY - CHAP

T1 - The mutual relation between patents and R&D

AU - Ophem, van, H.

AU - Brouwer, E.

AU - Kleinknecht, A.H.

AU - Mohnen, P.

PY - 2002

Y1 - 2002

U2 - 10.1057/9780230595880_3

DO - 10.1057/9780230595880_3

M3 - Chapter

SN - 0-333-96109-9

SP - 56

EP - 70

BT - Innovation and firm performance : econometric explorations of survey data

A2 - Kleinknecht, A.H.

A2 - Mohnen, P.

PB - Palgrave

CY - London

ER -