The macro-economic effects of intensive patenting industries - Or: Why we could be all better off with less patenting

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 9th IEEE European test symposium
Place of Publication	Ajaccio
Publication status	Published - 2004
Event	9th IEEE European Test Symposium (ETS 2004) - Ajaccio, France Duration: 23 May 2004 → 26 May 2004 Conference number: 9 http://www.ieee-ets.org/past_events/ets04/

Conference	9th IEEE European Test Symposium (ETS 2004)
Abbreviated title	ETS 2004
Country/Territory	France
City	Ajaccio
Period	23/05/04 → 26/05/04
Internet address	http://www.ieee-ets.org/past_events/ets04/

Cite this

@inproceedings{46841e1be03e4d07b60350abdbfe91d5,

title = "The macro-economic effects of intensive patenting industries - Or: Why we could be all better off with less patenting",

author = "R.N.A. Bekkers",

year = "2004",

language = "English",

booktitle = "Proceedings of the 9th IEEE European test symposium",

note = "9th IEEE European Test Symposium (ETS 2004), ETS 2004 ; Conference date: 23-05-2004 Through 26-05-2004",

url = "http://www.ieee-ets.org/past\_events/ets04/",

}

TY - GEN

T1 - The macro-economic effects of intensive patenting industries - Or: Why we could be all better off with less patenting

AU - Bekkers, R.N.A.

N1 - Conference code: 9

PY - 2004

Y1 - 2004

M3 - Conference contribution

BT - Proceedings of the 9th IEEE European test symposium

CY - Ajaccio

T2 - 9th IEEE European Test Symposium (ETS 2004)

Y2 - 23 May 2004 through 26 May 2004

ER -