The influence of inhogeneous carrier-density on the dependence of resistance and noise on gate voltage

L.K.J. Vandamme, Z. Gingl, D. Sodini

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 3rd ELEN Workshop
Pages73-77
Publication statusPublished - 1996
Event3rd ELEN Workshop - Leuven, Belgium
Duration: 5 Nov 19967 Nov 1996

Conference

Conference3rd ELEN Workshop
CountryBelgium
CityLeuven
Period5/11/967/11/96

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