The influence of inhogeneous carrier-density on the dependence of resistance and noise on gate voltage

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 3rd ELEN Workshop
Pages	73-77
Publication status	Published - 1996
Event	3rd ELEN Workshop - Leuven, Belgium Duration: 5 Nov 1996 → 7 Nov 1996

Cite this

@inproceedings{abd80aff89f94381bf474f6170a17456,

title = "The influence of inhogeneous carrier-density on the dependence of resistance and noise on gate voltage",

author = "L.K.J. Vandamme and Z. Gingl and D. Sodini",

year = "1996",

language = "English",

pages = "73--77",

booktitle = "Proc. 3rd ELEN Workshop",

note = "3rd ELEN Workshop ; Conference date: 05-11-1996 Through 07-11-1996",

}