The influence of extra carrier noise on vertical-cavity surface-emitting laser

M.C. Soriano, G. Sande, van der, G. Verschaffelt, M. Peeters, M. Yousefi, D. Lenstra, J. Danckaert

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

We find experimentally that the relaxation oscillation (RO) peak in the relative intensity noise (RIN) of a semiconductor laser broadens by adding noise to the pump current. In our experiments we use a vertical-cavity surface-emitting laser. The broadening of the RIN peak with increasing carrier noise level is interpreted to be due to an increase of the non-linear gain saturation.
Original languageEnglish
Title of host publicationProceedings 2004 ninth annual symposium of the IEEE/LEOS Benelux Chapter : December 2-3, 2004, Ghent, Belgium
Place of PublicationGent
PublisherInstitute of Electrical and Electronics Engineers
Pages49-52
ISBN (Print)90-76546-06-1
Publication statusPublished - 2004
Event9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium - Ghent, Belgium
Duration: 2 Dec 20043 Dec 2004

Conference

Conference9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium
CountryBelgium
CityGhent
Period2/12/043/12/04

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