Abstract
A model is proposed to assign the hydrogen complexes in amorphous and nano/microcrystalline silicon to the hydride stretching modes in infrared spectra. We demonstrate that this analysis approach is a helpful tool to characterize the material properties of amorphous and microcrystalline silicon.
| Original language | English |
|---|---|
| Title of host publication | 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 721-724 |
| Number of pages | 4 |
| ISBN (Print) | 9781424429509 |
| DOIs | |
| Publication status | Published - 1 Dec 2009 |
| Event | 34th IEEE Photovoltaic Specialists Conference (PVSC 2009) - Philadelphia, United States Duration: 7 Jun 2009 → 12 Jun 2009 Conference number: 34 |
Conference
| Conference | 34th IEEE Photovoltaic Specialists Conference (PVSC 2009) |
|---|---|
| Abbreviated title | PVSC 2009 |
| Country/Territory | United States |
| City | Philadelphia |
| Period | 7/06/09 → 12/06/09 |