Abstract
A model is proposed to assign the hydrogen complexes in amorphous and nano/microcrystalline silicon to the hydride stretching modes in infrared spectra. We demonstrate that this analysis approach is a helpful tool to characterize the material properties of amorphous and microcrystalline silicon.
Original language | English |
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Title of host publication | 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 721-724 |
Number of pages | 4 |
ISBN (Print) | 9781424429509 |
DOIs | |
Publication status | Published - 1 Dec 2009 |
Event | 34th IEEE Photovoltaic Specialists Conference (PVSC 2009) - Philadelphia, United States Duration: 7 Jun 2009 → 12 Jun 2009 Conference number: 34 |
Conference
Conference | 34th IEEE Photovoltaic Specialists Conference (PVSC 2009) |
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Abbreviated title | PVSC 2009 |
Country/Territory | United States |
City | Philadelphia |
Period | 7/06/09 → 12/06/09 |