The gate voltage dependence of the 1/f noise parameter alpha in MOS transistors

L.K.J. Vandamme

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publication13th International Conference on Noise in Physical Systems and 1/f Fluctuations
Place of PublicationSingapore
PublisherWorld Scientific
Pages397-403
Publication statusPublished - 1995
Event13th International Conference on Noise in Physical Systems and 1/f Fluctuations - Palanga, Lithuania
Duration: 29 May 19953 Jun 1995

Conference

Conference13th International Conference on Noise in Physical Systems and 1/f Fluctuations
Country/TerritoryLithuania
CityPalanga
Period29/05/953/06/95

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