The effect of temperature and deformation on the recrystallization of doped tungsten wires

G.D. Rieck

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Abstract

The influence on the recrystallization texture and crystal size of three different dopes in tungsten wires were studied with X-ray diffraction and microscopically. Two main types of preferred orientation are produced, the [110], [320], etc., type (A), and the [531] or [421] type (B). The ratio in which those types occur and the crystal size depend with each dope on the annealing temperature and, as proved for the normal K-Si-Al dope, also on the degree of deformation of the wire. At temperatures of about 2000°C a [110]-type recrystallization texture is always found; at higher temperatures the ratio A B changes in favour of the B-type. The decrease in diameter of the wire is only of influence if it results from mechanical deformation. With diameters larger than 250 μ, type A dominates; the maximum of B-type orientations is found in (K, Si, A1) doped wires of 180 μ. This behaviour can be explained by the theory of the "damaged dope-skins" and by the relatively difficult deformation of the crystals with B-type orientation.

Original languageEnglish
Pages (from-to)825-834
Number of pages10
JournalActa Metallurgica
Volume9
Issue number9
DOIs
Publication statusPublished - Sep 1961

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