The analysis of spot defect induced faults in MOS circuits

C. Di; J. Pineda de Gyvez

doi:10.1109/CICCAS.1991.184394

The analysis of spot defect induced faults in MOS circuits

C. Di, J. Pineda de Gyvez

Electronic Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

154 Downloads (Pure)

Abstract

A strategy for modeling spot defect induced faults by their corresponding Boolean functions is developed. The presented strategy is based on the principle of local conduction path analysis. This way of modeling is much more general in the sense that all kinds of faults are unified by one concept, the Boolean function. In this way testing related applications can be done efficiently and can maintain a high quality

Original language	English
Title of host publication	Proceedings of the 1991 International Conference on Circuits and Systems, 16-17 June 1991, Shenzhen, China
Place of Publication	New York
Publisher	Institute of Electrical and Electronics Engineers
Pages	478-481
DOIs	https://doi.org/10.1109/CICCAS.1991.184394
Publication status	Published - 1991

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10.1109/CICCAS.1991.184394

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title = "The analysis of spot defect induced faults in MOS circuits",

abstract = "A strategy for modeling spot defect induced faults by their corresponding Boolean functions is developed. The presented strategy is based on the principle of local conduction path analysis. This way of modeling is much more general in the sense that all kinds of faults are unified by one concept, the Boolean function. In this way testing related applications can be done efficiently and can maintain a high quality",

author = "C. Di and {Pineda de Gyvez}, J.",

year = "1991",

doi = "10.1109/CICCAS.1991.184394",

language = "English",

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The analysis of spot defect induced faults in MOS circuits. / Di, C.; Pineda de Gyvez, J.
Proceedings of the 1991 International Conference on Circuits and Systems, 16-17 June 1991, Shenzhen, China. New York: Institute of Electrical and Electronics Engineers, 1991. p. 478-481.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Di, C.

AU - Pineda de Gyvez, J.

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Y1 - 1991

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AB - A strategy for modeling spot defect induced faults by their corresponding Boolean functions is developed. The presented strategy is based on the principle of local conduction path analysis. This way of modeling is much more general in the sense that all kinds of faults are unified by one concept, the Boolean function. In this way testing related applications can be done efficiently and can maintain a high quality

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DO - 10.1109/CICCAS.1991.184394

M3 - Conference contribution

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BT - Proceedings of the 1991 International Conference on Circuits and Systems, 16-17 June 1991, Shenzhen, China

PB - Institute of Electrical and Electronics Engineers

CY - New York

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The analysis of spot defect induced faults in MOS circuits

Abstract

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