Testing times : on model-driven test generation for non-deterministic real-time systems

E. Brinksma

doi:10.1109/CSD.2004.1309110

Testing times : on model-driven test generation for non-deterministic real-time systems

E. Brinksma

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings 4th International Conference on Application of Concurrency to System Design (ACSD 2004, Hamilton, Canada, June 16-18, 2004)
Publisher	IEEE Computer Society
Pages	3-4
ISBN (Print)	0-7695-2077-4
DOIs	https://doi.org/10.1109/CSD.2004.1309110
Publication status	Published - 2004

Access to Document

10.1109/CSD.2004.1309110

Cite this

@inproceedings{df9e7af22e7b407cb12bda9c52026534,

title = "Testing times : on model-driven test generation for non-deterministic real-time systems",

author = "E. Brinksma",

year = "2004",

doi = "10.1109/CSD.2004.1309110",

language = "English",

isbn = "0-7695-2077-4",

pages = "3--4",

booktitle = "Proceedings 4th International Conference on Application of Concurrency to System Design (ACSD 2004, Hamilton, Canada, June 16-18, 2004)",

publisher = "IEEE Computer Society",

address = "United States",

}

Testing times : on model-driven test generation for non-deterministic real-time systems. / Brinksma, E.
Proceedings 4th International Conference on Application of Concurrency to System Design (ACSD 2004, Hamilton, Canada, June 16-18, 2004). IEEE Computer Society, 2004. p. 3-4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Testing times : on model-driven test generation for non-deterministic real-time systems

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PY - 2004

Y1 - 2004

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DO - 10.1109/CSD.2004.1309110

M3 - Conference contribution

SN - 0-7695-2077-4

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EP - 4

BT - Proceedings 4th International Conference on Application of Concurrency to System Design (ACSD 2004, Hamilton, Canada, June 16-18, 2004)

PB - IEEE Computer Society

ER -