Testing of UHV and EHV Circuit-Breakers: Limitations, Solutions and Challenges

R.P.P. Smeets, L.H. Paske, te, P. Knol

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publication6th International Seminar on Switchgear & Controlgear, Mumbai
Publication statusPublished - 2004
Eventconference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19 -
Duration: 18 Nov 200419 Nov 2004

Conference

Conferenceconference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19
Period18/11/0419/11/04
Other6th International Seminar on Switchgear & Controlgear, Mumbai, India

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