Testing of UHV and EHV Circuit-Breakers: Limitations, Solutions and Challenges

R.P.P. Smeets; L.H. Paske, te; P. Knol

Testing of UHV and EHV Circuit-Breakers: Limitations, Solutions and Challenges

R.P.P. Smeets, L.H. Paske, te, P. Knol

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	6th International Seminar on Switchgear & Controlgear, Mumbai
Publication status	Published - 2004
Event	conference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19 - Duration: 18 Nov 2004 → 19 Nov 2004

Conference

Conference	conference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19
Period	18/11/04 → 19/11/04
Other	6th International Seminar on Switchgear & Controlgear, Mumbai, India

Cite this

@inproceedings{aa30de21220c4327bd6930e1aa5fb330,

title = "Testing of UHV and EHV Circuit-Breakers: Limitations, Solutions and Challenges",

author = "R.P.P. Smeets and {Paske, te}, L.H. and P. Knol",

year = "2004",

language = "English",

booktitle = "6th International Seminar on Switchgear & Controlgear, Mumbai",

note = "conference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19 ; Conference date: 18-11-2004 Through 19-11-2004",

}

TY - GEN

T1 - Testing of UHV and EHV Circuit-Breakers: Limitations, Solutions and Challenges

AU - Smeets, R.P.P.

AU - Paske, te, L.H.

AU - Knol, P.

PY - 2004

Y1 - 2004

M3 - Conference contribution

BT - 6th International Seminar on Switchgear & Controlgear, Mumbai

T2 - conference; 6th International Seminar on Switchgear & Controlgear, Mumbai, India; 2004-11-18; 2004-11-19

Y2 - 18 November 2004 through 19 November 2004

ER -