Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring

Kazuki Monta; Leonidas Kataselas; Ferenc Fodor; Alkis Hatzopoulos; Makoto Nagata; Erik Jan Marinissen

doi:10.1109/ETS50041.2021.9465391

Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring

Kazuki Monta, Leonidas Kataselas, Ferenc Fodor, Alkis Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

Electronic Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Abstract

On-chip monitor (OCM) circuits capture dynamic power-supply (PS) waveforms within power domains individually bounded by dedicated micro voltage regulator modules (μVRMs). This paper uses OCM to diagnose VLSI circuits with a modular power management, where the evolution over time of the gate switching count, in the clock tree, the flip-flops, and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement gives us a warning for either (1) faulty behavior in the IC hardware, or (2) bugs in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm technology. The OCM measurements at 100 ps and 100 μV are capable of reaching a resolution of 18.7 fC/gate. This is approximately equivalent to the amount of charge consumed by a single two-input NAND gate.

Original language	English
Title of host publication	2021 IEEE European Test Symposium (ETS)
Publisher	Institute of Electrical and Electronics Engineers
Number of pages	4
ISBN (Electronic)	978-1-6654-1849-2
DOIs	https://doi.org/10.1109/ETS50041.2021.9465391
Publication status	Published - 29 Jun 2021
Event	26th IEEE European Test Symposium, ETS 2021 - Virtual/Online, Bruges, Belgium Duration: 24 May 2021 → 28 May 2021 Conference number: 26 http://ets2021.eu

Conference

Conference	26th IEEE European Test Symposium, ETS 2021
Abbreviated title	ETS
Country/Territory	Belgium
City	Bruges
Period	24/05/21 → 28/05/21
Internet address	http://ets2021.eu

Keywords

background diagnosis
digital circuits
integrated circuits
low power testing
on-chip monitoring
power integrity
Power noise
VLSI circuits

Access to Document

10.1109/ETS50041.2021.9465391

Cite this

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title = "Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring",

abstract = "On-chip monitor (OCM) circuits capture dynamic power-supply (PS) waveforms within power domains individually bounded by dedicated micro voltage regulator modules (μVRMs). This paper uses OCM to diagnose VLSI circuits with a modular power management, where the evolution over time of the gate switching count, in the clock tree, the flip-flops, and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement gives us a warning for either (1) faulty behavior in the IC hardware, or (2) bugs in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm technology. The OCM measurements at 100 ps and 100 μV are capable of reaching a resolution of 18.7 fC/gate. This is approximately equivalent to the amount of charge consumed by a single two-input NAND gate.",

keywords = "background diagnosis, digital circuits, integrated circuits, low power testing, on-chip monitoring, power integrity, Power noise, VLSI circuits",

author = "Kazuki Monta and Leonidas Kataselas and Ferenc Fodor and Alkis Hatzopoulos and Makoto Nagata and Marinissen, {Erik Jan}",

year = "2021",

month = jun,

day = "29",

doi = "10.1109/ETS50041.2021.9465391",

language = "English",

booktitle = "2021 IEEE European Test Symposium (ETS)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "26th IEEE European Test Symposium, ETS 2021, ETS ; Conference date: 24-05-2021 Through 28-05-2021",

url = "http://ets2021.eu",

}

Monta, K, Kataselas, L, Fodor, F, Hatzopoulos, A, Nagata, M & Marinissen, EJ 2021, Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring. in 2021 IEEE European Test Symposium (ETS)., 9465391, Institute of Electrical and Electronics Engineers, 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, 24/05/21. https://doi.org/10.1109/ETS50041.2021.9465391

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T1 - Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring

AU - Monta, Kazuki

AU - Kataselas, Leonidas

AU - Fodor, Ferenc

AU - Hatzopoulos, Alkis

AU - Nagata, Makoto

AU - Marinissen, Erik Jan

N1 - Conference code: 26

PY - 2021/6/29

Y1 - 2021/6/29

N2 - On-chip monitor (OCM) circuits capture dynamic power-supply (PS) waveforms within power domains individually bounded by dedicated micro voltage regulator modules (μVRMs). This paper uses OCM to diagnose VLSI circuits with a modular power management, where the evolution over time of the gate switching count, in the clock tree, the flip-flops, and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement gives us a warning for either (1) faulty behavior in the IC hardware, or (2) bugs in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm technology. The OCM measurements at 100 ps and 100 μV are capable of reaching a resolution of 18.7 fC/gate. This is approximately equivalent to the amount of charge consumed by a single two-input NAND gate.

AB - On-chip monitor (OCM) circuits capture dynamic power-supply (PS) waveforms within power domains individually bounded by dedicated micro voltage regulator modules (μVRMs). This paper uses OCM to diagnose VLSI circuits with a modular power management, where the evolution over time of the gate switching count, in the clock tree, the flip-flops, and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement gives us a warning for either (1) faulty behavior in the IC hardware, or (2) bugs in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm technology. The OCM measurements at 100 ps and 100 μV are capable of reaching a resolution of 18.7 fC/gate. This is approximately equivalent to the amount of charge consumed by a single two-input NAND gate.

KW - background diagnosis

KW - digital circuits

KW - integrated circuits

KW - low power testing

KW - on-chip monitoring

KW - power integrity

KW - Power noise

KW - VLSI circuits

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DO - 10.1109/ETS50041.2021.9465391

M3 - Conference contribution

AN - SCOPUS:85113708488

BT - 2021 IEEE European Test Symposium (ETS)

PB - Institute of Electrical and Electronics Engineers

T2 - 26th IEEE European Test Symposium, ETS 2021

Y2 - 24 May 2021 through 28 May 2021

ER -

Testing Embedded Toggle Pattern Generation through On-Chip IR Drop Monitoring

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