Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

Kazuki Monta; Leonidas Katselas; Ferenc Fodor; Takuji Miki; Alkis Hatzopoulos; Makoto Nagata; Erik Jan Marinissen

doi:10.1109/MDAT.2022.3178050

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

Kazuki Monta (Corresponding author), Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

Electronic Systems

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Abstract

Editor's notes: The authors present an IR-drop-based power-domain-scenario-based test methodology along with an in-field diagnosis technique. This utilizes on-chip monitor (OCM) circuits, and the toggle patterns can be designed with test pattern generation algorithms.

Original language	English
Pages (from-to)	79-87
Number of pages	9
Journal	IEEE Design & Test
Volume	39
Issue number	5
DOIs	https://doi.org/10.1109/MDAT.2022.3178050
Publication status	Published - 1 Oct 2022

Bibliographical note

Funding Information:
This work was supported by JSPS KAKENHI under Grant JP22H04999.

Funding

This work was supported by JSPS KAKENHI under Grant JP22H04999.

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10.1109/MDAT.2022.3178050

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Cite this

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title = "Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements",

abstract = "Editor's notes: The authors present an IR-drop-based power-domain-scenario-based test methodology along with an in-field diagnosis technique. This utilizes on-chip monitor (OCM) circuits, and the toggle patterns can be designed with test pattern generation algorithms.",

author = "Kazuki Monta and Leonidas Katselas and Ferenc Fodor and Takuji Miki and Alkis Hatzopoulos and Makoto Nagata and Marinissen, \{Erik Jan\}",

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AU - Monta, Kazuki

AU - Katselas, Leonidas

AU - Fodor, Ferenc

AU - Miki, Takuji

AU - Hatzopoulos, Alkis

AU - Nagata, Makoto

AU - Marinissen, Erik Jan

N1 - Funding Information: This work was supported by JSPS KAKENHI under Grant JP22H04999.

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N2 - Editor's notes: The authors present an IR-drop-based power-domain-scenario-based test methodology along with an in-field diagnosis technique. This utilizes on-chip monitor (OCM) circuits, and the toggle patterns can be designed with test pattern generation algorithms.

AB - Editor's notes: The authors present an IR-drop-based power-domain-scenario-based test methodology along with an in-field diagnosis technique. This utilizes on-chip monitor (OCM) circuits, and the toggle patterns can be designed with test pattern generation algorithms.

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Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

Abstract

Bibliographical note

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