Testing embedded-core based system chips

Y. Zorian, E.J. Marinissen, S. Dey

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

316 Citations (Scopus)

Abstract

Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design in which every circuit is designed from scratch and reuse is limited to standard-cell libraries, is more and more replaced by a design style based on embedding large reusable modules, the so-called cores. This core-based design poses a series of new challenges, especially in the domains of manufacturing test and design validation and debug. This paper provides an overview of current industrial practices as well as academic research in these areas. We also discuss industry-wide efforts by VSIA and IEEE P1500 and describe the challenges for future research.
Original languageEnglish
Title of host publicationProceedings International Test Conference 1998
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages130-143
ISBN (Print)0-7803-5093-6
DOIs
Publication statusPublished - 1998
Externally publishedYes

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