Test time reduction by optimal test sequencing

R. Boumen; I.S.M. Jong, de; J.M. Mortel - Fronczak, van de; J.E. Rooda

doi:10.1002/j.2334-5837.2006.tb02741.x

Test time reduction by optimal test sequencing

R. Boumen, I.S.M. Jong, de, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Testing complex manufacturing systems, like ASML lithographic machines (ASML 2005), can take up to 45% of the total development time of a system. This test time can be reduced by choosing wisely which test cases must be performed in which sequence, without making investments in test cases or the system. With the test sequencing method, developed by (Boumen 2005, 2006), it is possible to make these decisions such that a time, cost and/or quality optimal test sequence can be constructed. This paper shows with two case studies that test time can be reduced up to 20% without loss of quality with this method. The first case study is related to the test phase during the manufacturing of a lithographic machine. The second case study is related to the reliability testing of a first of a kind lithographic machine.

Original language	English
Title of host publication	Proceedings of the 16th Annual International Symposium of the International Council on System Engineering (INCOSE2006), 9-13 July 2006, Orlando, Florida, USA
DOIs	https://doi.org/10.1002/j.2334-5837.2006.tb02741.x
Publication status	Published - 2006

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title = "Test time reduction by optimal test sequencing",

abstract = "Testing complex manufacturing systems, like ASML lithographic machines (ASML 2005), can take up to 45\% of the total development time of a system. This test time can be reduced by choosing wisely which test cases must be performed in which sequence, without making investments in test cases or the system. With the test sequencing method, developed by (Boumen 2005, 2006), it is possible to make these decisions such that a time, cost and/or quality optimal test sequence can be constructed. This paper shows with two case studies that test time can be reduced up to 20\% without loss of quality with this method. The first case study is related to the test phase during the manufacturing of a lithographic machine. The second case study is related to the reliability testing of a first of a kind lithographic machine.",

author = "R. Boumen and \{Jong, de\}, I.S.M. and \{Mortel - Fronczak, van de\}, J.M. and J.E. Rooda",

year = "2006",

doi = "10.1002/j.2334-5837.2006.tb02741.x",

language = "English",

booktitle = "Proceedings of the 16th Annual International Symposium of the International Council on System Engineering (INCOSE2006), 9-13 July 2006, Orlando, Florida, USA",

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Test time reduction by optimal test sequencing. / Boumen, R.; Jong, de, I.S.M.; Mortel - Fronczak, van de, J.M. et al.
Proceedings of the 16th Annual International Symposium of the International Council on System Engineering (INCOSE2006), 9-13 July 2006, Orlando, Florida, USA. 2006.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Test time reduction by optimal test sequencing

AU - Boumen, R.

AU - Jong, de, I.S.M.

AU - Mortel - Fronczak, van de, J.M.

AU - Rooda, J.E.

PY - 2006

Y1 - 2006

N2 - Testing complex manufacturing systems, like ASML lithographic machines (ASML 2005), can take up to 45% of the total development time of a system. This test time can be reduced by choosing wisely which test cases must be performed in which sequence, without making investments in test cases or the system. With the test sequencing method, developed by (Boumen 2005, 2006), it is possible to make these decisions such that a time, cost and/or quality optimal test sequence can be constructed. This paper shows with two case studies that test time can be reduced up to 20% without loss of quality with this method. The first case study is related to the test phase during the manufacturing of a lithographic machine. The second case study is related to the reliability testing of a first of a kind lithographic machine.

AB - Testing complex manufacturing systems, like ASML lithographic machines (ASML 2005), can take up to 45% of the total development time of a system. This test time can be reduced by choosing wisely which test cases must be performed in which sequence, without making investments in test cases or the system. With the test sequencing method, developed by (Boumen 2005, 2006), it is possible to make these decisions such that a time, cost and/or quality optimal test sequence can be constructed. This paper shows with two case studies that test time can be reduced up to 20% without loss of quality with this method. The first case study is related to the test phase during the manufacturing of a lithographic machine. The second case study is related to the reliability testing of a first of a kind lithographic machine.

U2 - 10.1002/j.2334-5837.2006.tb02741.x

DO - 10.1002/j.2334-5837.2006.tb02741.x

M3 - Conference contribution

BT - Proceedings of the 16th Annual International Symposium of the International Council on System Engineering (INCOSE2006), 9-13 July 2006, Orlando, Florida, USA

ER -

Test time reduction by optimal test sequencing

Abstract

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