Test time reduction by optimal test sequencing

R. Boumen, I.S.M. Jong, de, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageEnglish
Title of host publicationTangram: Model-based integration and testing of complex high-tech systems
EditorsJ. Tretmans
Place of PublicationEindhoven
PublisherEmbedded Systems Institute
Chapter5
Pages61-72
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

Cite this

Boumen, R., Jong, de, I. S. M., Mortel - Fronczak, van de, J. M., & Rooda, J. E. (2007). Test time reduction by optimal test sequencing. In J. Tretmans (Ed.), Tangram: Model-based integration and testing of complex high-tech systems (pp. 61-72). Eindhoven: Embedded Systems Institute.
Boumen, R. ; Jong, de, I.S.M. ; Mortel - Fronczak, van de, J.M. ; Rooda, J.E. / Test time reduction by optimal test sequencing. Tangram: Model-based integration and testing of complex high-tech systems. editor / J. Tretmans. Eindhoven : Embedded Systems Institute, 2007. pp. 61-72
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Boumen, R, Jong, de, ISM, Mortel - Fronczak, van de, JM & Rooda, JE 2007, Test time reduction by optimal test sequencing. in J Tretmans (ed.), Tangram: Model-based integration and testing of complex high-tech systems. Embedded Systems Institute, Eindhoven, pp. 61-72.

Test time reduction by optimal test sequencing. / Boumen, R.; Jong, de, I.S.M.; Mortel - Fronczak, van de, J.M.; Rooda, J.E.

Tangram: Model-based integration and testing of complex high-tech systems. ed. / J. Tretmans. Eindhoven : Embedded Systems Institute, 2007. p. 61-72.

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

TY - CHAP

T1 - Test time reduction by optimal test sequencing

AU - Boumen, R.

AU - Jong, de, I.S.M.

AU - Mortel - Fronczak, van de, J.M.

AU - Rooda, J.E.

PY - 2007

Y1 - 2007

M3 - Chapter

SN - 978-90-78679-02-8

SP - 61

EP - 72

BT - Tangram: Model-based integration and testing of complex high-tech systems

A2 - Tretmans, J.

PB - Embedded Systems Institute

CY - Eindhoven

ER -

Boumen R, Jong, de ISM, Mortel - Fronczak, van de JM, Rooda JE. Test time reduction by optimal test sequencing. In Tretmans J, editor, Tangram: Model-based integration and testing of complex high-tech systems. Eindhoven: Embedded Systems Institute. 2007. p. 61-72