Test time reduction by optimal test sequencing

R. Boumen, I.S.M. Jong, de, J.M. Mortel - Fronczak, van de, J.E. Rooda

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageEnglish
    Title of host publicationTangram: Model-based integration and testing of complex high-tech systems
    EditorsJ. Tretmans
    Place of PublicationEindhoven
    PublisherEmbedded Systems Institute
    ISBN (Print)978-90-78679-02-8
    Publication statusPublished - 2007

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