Test time reduction by optimal test sequencing

R. Boumen, I.S.M. Jong, de, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

Original language	English
Title of host publication	Tangram: Model-based integration and testing of complex high-tech systems
Editors	J. Tretmans
Place of Publication	Eindhoven
Publisher	Embedded Systems Institute
Chapter	5
Pages	61-72
ISBN (Print)	978-90-78679-02-8
Publication status	Published - 2007

Cite this

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title = "Test time reduction by optimal test sequencing",

author = "R. Boumen and {Jong, de}, I.S.M. and {Mortel - Fronczak, van de}, J.M. and J.E. Rooda",

year = "2007",

language = "English",

isbn = "978-90-78679-02-8",

pages = "61--72",

editor = "J. Tretmans",

booktitle = "Tangram: Model-based integration and testing of complex high-tech systems",

publisher = "Embedded Systems Institute",

}

TY - CHAP

T1 - Test time reduction by optimal test sequencing

AU - Boumen, R.

AU - Jong, de, I.S.M.

AU - Mortel - Fronczak, van de, J.M.

AU - Rooda, J.E.

PY - 2007

Y1 - 2007

M3 - Chapter

SN - 978-90-78679-02-8

SP - 61

EP - 72

BT - Tangram: Model-based integration and testing of complex high-tech systems

A2 - Tretmans, J.

PB - Embedded Systems Institute

CY - Eindhoven

ER -