Abstract
Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et al. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually.
| Original language | English |
|---|---|
| Pages (from-to) | 25-37 |
| Journal | IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans |
| Volume | 38 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2008 |
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Cite this
Boumen, R., Jong, de, I. S. M., Vermunt, J. W. H., Mortel - Fronczak, van de, J. M., & Rooda, J. E. (2008). Test sequencing in complex manufacturing systems. IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans, 38(1), 25-37. https://doi.org/10.1109/TSMCA.2007.909494