TY - JOUR
T1 - Test sequencing in complex manufacturing systems
AU - Boumen, R.
AU - Jong, de, I.S.M.
AU - Vermunt, J.W.H.
AU - Mortel - Fronczak, van de, J.M.
AU - Rooda, J.E.
PY - 2008
Y1 - 2008
N2 - Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et al. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually.
AB - Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et al. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually.
U2 - 10.1109/TSMCA.2007.909494
DO - 10.1109/TSMCA.2007.909494
M3 - Article
SN - 1083-4427
VL - 38
SP - 25
EP - 37
JO - IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans
JF - IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans
IS - 1
ER -