Test selections and coverages

N. Goga; F. Moldoveanu

doi:10.1109/CCECE.2004.1345212

Test selections and coverages

N. Goga
, F. Moldoveanu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. This paper tries to built up a solution for this necessity.

Original language	English
Title of host publication	Proceedings 17th Annual IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2004, Niagara Falls ON, Canada, May 2-5, 2004
Publisher	Institute of Electrical and Electronics Engineers
Pages	707-710
Volume	2
ISBN (Print)	0-7803-8253-6
DOIs	https://doi.org/10.1109/CCECE.2004.1345212
Publication status	Published - 2004

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10.1109/CCECE.2004.1345212

Cite this

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title = "Test selections and coverages",

abstract = "One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. This paper tries to built up a solution for this necessity.",

author = "N. Goga and F. Moldoveanu",

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publisher = "Institute of Electrical and Electronics Engineers",

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Test selections and coverages. / Goga, N.; Moldoveanu, F.
Proceedings 17th Annual IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2004, Niagara Falls ON, Canada, May 2-5, 2004. Vol. 2 Institute of Electrical and Electronics Engineers, 2004. p. 707-710.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Moldoveanu, F.

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AB - One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. This paper tries to built up a solution for this necessity.

U2 - 10.1109/CCECE.2004.1345212

DO - 10.1109/CCECE.2004.1345212

M3 - Conference contribution

SN - 0-7803-8253-6

VL - 2

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BT - Proceedings 17th Annual IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2004, Niagara Falls ON, Canada, May 2-5, 2004

PB - Institute of Electrical and Electronics Engineers

ER -

Test selections and coverages

Abstract

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