Abstract
One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. This paper tries to built up a solution for this necessity.
Original language | English |
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Title of host publication | Proceedings 17th Annual IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2004, Niagara Falls ON, Canada, May 2-5, 2004 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 707-710 |
Volume | 2 |
ISBN (Print) | 0-7803-8253-6 |
DOIs | |
Publication status | Published - 2004 |