One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. This paper tries to built up a solution for this necessity.
|Title of host publication||Proceedings 17th Annual IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2004, Niagara Falls ON, Canada, May 2-5, 2004|
|Publisher||Institute of Electrical and Electronics Engineers|
|Publication status||Published - 2004|