Test quality analysis and improvement for an embedded asynchronous FIFO

T. Dubois; E.J. Marinissen; M. Azimane; P. Wielage; E. Larsson; C. Wouters

doi:10.1109/DATE.2007.364400

Test quality analysis and improvement for an embedded asynchronous FIFO

T. Dubois
, E.J. Marinissen
, M. Azimane
, P. Wielage
, E. Larsson
, C. Wouters

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

4 Citations (Scopus)

Abstract

Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods

Original language	English
Title of host publication	2007 Design, Automation & Test in Europe (DATE) Conference & Exhibition
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Number of pages	6
ISBN (Print)	978-3-9810801-2-4
DOIs	https://doi.org/10.1109/DATE.2007.364400
Publication status	Published - 2007
Externally published	Yes
Event	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) - Acropolis, Nice, France Duration: 16 Apr 2007 → 20 Apr 2007 Conference number: 10

Conference

Conference	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007)
Abbreviated title	DATE 2007
Country/Territory	France
City	Nice
Period	16/04/07 → 20/04/07

Access to Document

10.1109/DATE.2007.364400

Cite this

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title = "Test quality analysis and improvement for an embedded asynchronous FIFO",

abstract = "Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100\% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods",

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year = "2007",

doi = "10.1109/DATE.2007.364400",

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Dubois, T, Marinissen, EJ, Azimane, M, Wielage, P, Larsson, E & Wouters, C 2007, Test quality analysis and improvement for an embedded asynchronous FIFO. in 2007 Design, Automation & Test in Europe (DATE) Conference & Exhibition ., 4211910, Institute of Electrical and Electronics Engineers, Piscataway, 10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007), Nice, France, 16/04/07. https://doi.org/10.1109/DATE.2007.364400

Test quality analysis and improvement for an embedded asynchronous FIFO. / Dubois, T.; Marinissen, E.J.; Azimane, M. et al.
2007 Design, Automation & Test in Europe (DATE) Conference & Exhibition . Piscataway: Institute of Electrical and Electronics Engineers, 2007. 4211910.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

TY - CHAP

T1 - Test quality analysis and improvement for an embedded asynchronous FIFO

AU - Dubois, T.

AU - Marinissen, E.J.

AU - Azimane, M.

AU - Wielage, P.

AU - Larsson, E.

AU - Wouters, C.

N1 - Conference code: 10

PY - 2007

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N2 - Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods

AB - Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods

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DO - 10.1109/DATE.2007.364400

M3 - Chapter

SN - 978-3-9810801-2-4

BT - 2007 Design, Automation & Test in Europe (DATE) Conference & Exhibition

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007)

Y2 - 16 April 2007 through 20 April 2007

ER -

Test quality analysis and improvement for an embedded asynchronous FIFO

Abstract

Conference

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