Test methods and processes in manufacturing chain of photonic integrated circuits

Sylwester Latkowski; Dzmitry Pustakhod; Weiming Yao; Xaveer Leijtens; Kevin Williams

doi:10.1109/ICTON.2018.8473652

Test methods and processes in manufacturing chain of photonic integrated circuits

Sylwester Latkowski, Dzmitry Pustakhod, Weiming Yao, Xaveer Leijtens, Kevin Williams

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

7 Citations (Scopus)

2 Downloads (Pure)

Abstract

Access to fabrication of photonic integrated circuits is enabled via multi-project wafer runs offered by foundries. Such services open a path for proof-of-concept demonstrators and advanced prototypes. However, the technology processes behind those services need extensive developments in order to be scalable and suitable for volume production. Those developments are in a vast part related to test, assembly and packaging across the full PIC manufacturing chain. Standardization and automation of the test methods and equipment is essential for better statistical process control and scalability. When implemented, these will allow for early known-good-die identification, optimization of fabrication process window, improved yield and volume production.The challenges related to PIC testing will be discussed and current developments in our labs towards standardization and automation of test methods from a design phase to system level functional module evaluation will be presented.

Original language	English
Title of host publication	2018 20th International Conference on Transparent Optical Networks, ICTON 2018
Place of Publication	Piscataway
Publisher	IEEE Computer Society
Number of pages	4
ISBN (Electronic)	9781538666043
DOIs	https://doi.org/10.1109/ICTON.2018.8473652
Publication status	Published - 26 Sept 2018
Event	20th International Conference on Transparent Optical Networks, (ICTON 2018) - Bucharest, Romania Duration: 1 Jul 2018 → 5 Jul 2018 Conference number: 20 https://www.itl.waw.pl/en/conferences/icton/299-icton-2018/1505-icton-2018-preliminary-programme

Conference

Conference	20th International Conference on Transparent Optical Networks, (ICTON 2018)
Abbreviated title	ICTON2018
Country/Territory	Romania
City	Bucharest
Period	1/07/18 → 5/07/18
Internet address	https://www.itl.waw.pl/en/conferences/icton/299-icton-2018/1505-icton-2018-preliminary-programme

Funding

The authors would like to acknowledge European Union's Horizon 2020 programme (n° 431954 – PIXAPP) and the Stimulus OPZuid program through the Open Innovation Photonic ICs project (PROJ-00315) for supporting this work.

Keywords

photonic integrated circuits
photonic integration
test
test automation

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10.1109/ICTON.2018.8473652

Cite this

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title = "Test methods and processes in manufacturing chain of photonic integrated circuits",

abstract = "Access to fabrication of photonic integrated circuits is enabled via multi-project wafer runs offered by foundries. Such services open a path for proof-of-concept demonstrators and advanced prototypes. However, the technology processes behind those services need extensive developments in order to be scalable and suitable for volume production. Those developments are in a vast part related to test, assembly and packaging across the full PIC manufacturing chain. Standardization and automation of the test methods and equipment is essential for better statistical process control and scalability. When implemented, these will allow for early known-good-die identification, optimization of fabrication process window, improved yield and volume production.The challenges related to PIC testing will be discussed and current developments in our labs towards standardization and automation of test methods from a design phase to system level functional module evaluation will be presented.",

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Latkowski, S , Pustakhod, D , Yao, W , Leijtens, X & Williams, K 2018, Test methods and processes in manufacturing chain of photonic integrated circuits. in 2018 20th International Conference on Transparent Optical Networks, ICTON 2018., 8473652, IEEE Computer Society, Piscataway, 20th International Conference on Transparent Optical Networks, (ICTON 2018), Bucharest, Romania, 1/07/18. https://doi.org/10.1109/ICTON.2018.8473652

Test methods and processes in manufacturing chain of photonic integrated circuits. / Latkowski, Sylwester ; Pustakhod, Dzmitry ; Yao, Weiming et al.
2018 20th International Conference on Transparent Optical Networks, ICTON 2018. Piscataway: IEEE Computer Society, 2018. 8473652.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Test methods and processes in manufacturing chain of photonic integrated circuits

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