Test data volume comparison: monolithic vs. modular SoC testing

O. Sinanoglu, E.J. Marinissen, A. Sehgal, J. Fitzgerald, J. Rearick

Research output: Contribution to journalArticleAcademicpeer-review

16 Citations (Scopus)

Abstract

Containing production cost is a major concern for today's complex SoCs. One of the key contributors to production cost is test time and test data volume, for which numerous compression techniques were proposed. This article introduces a different approach to test data volume reduction, namely the use of modular test based on IEEE Std 1500 architecture, and it provides modeling, analysis, and quantification to support the proposed approach.
Original languageEnglish
Pages (from-to)25-37
Number of pages13
JournalIEEE Design and Test of Computers
Volume26
Issue number3
DOIs
Publication statusPublished - May 2009
Externally publishedYes

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