Test automation in the alpha test of wafer scanners

I.S.M. Jong, de, R. Boumen, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Abstract

In general, the goal of test automation is to reduce test time, to decrease the amount of manual labor and to increase the test coverage. In a time-to-market environment, like ASML, the primary goal of test automation is to minimize the total test duration. The total test duration is the time between test start and the moment that the system is fault free, so including diagnosing and fixing faults. Therefore, the total test duration is not only depending on the test case duration, also the diagnosis and fix duration (the fix-loop) influences the total test duration. Time to market can also be reduced by using a parallel test and fix strategy. In this strategy, available fixes are integrated on the system under test as soon as possible. Applying fixes as soon as possible results in fewer test cases failed in the remainder of the test phase, however the fixes may introduce new faults as well. The influence on total test duration of both applying test automation and aplying a parallel test and fix strategy has been investigated.
Original languageEnglish
Title of host publication11e Nederlandse testdag
Place of PublicationNetherlands, University of Twente, Netherlands
Pagesunknown-
Publication statusPublished - 2005

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