Test and diagnosis of power switches

Miroslav Valka; Alberto Bosio; Luigi Dilillo; Aida Todri; Arnaud Virazel; Patrick Girard; P. Debaud; S. Guilhot

doi:10.1109/DDECS.2014.6868792

Test and diagnosis of power switches

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.

Original language	English
Title of host publication	17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Publisher	Institute of Electrical and Electronics Engineers
Pages	213-218
Number of pages	6
ISBN (Electronic)	978-1-4799-4558-0
ISBN (Print)	978-1-4799-4560-3
DOIs	https://doi.org/10.1109/DDECS.2014.6868792
Publication status	Published - 2014
Externally published	Yes

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10.1109/DDECS.2014.6868792

Cite this

@inproceedings{8e93b6a7c0114764bef980e58f8922c0,

title = "Test and diagnosis of power switches",

abstract = "Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.",

author = "Miroslav Valka and Alberto Bosio and Luigi Dilillo and Aida Todri and Arnaud Virazel and Patrick Girard and P. Debaud and S. Guilhot",

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pages = "213--218",

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Test and diagnosis of power switches. / Valka, Miroslav; Bosio, Alberto; Dilillo, Luigi et al.
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, 2014. p. 213-218.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Test and diagnosis of power switches

AU - Valka, Miroslav

AU - Bosio, Alberto

AU - Dilillo, Luigi

AU - Todri, Aida

AU - Virazel, Arnaud

AU - Girard, Patrick

AU - Debaud, P.

AU - Guilhot, S.

PY - 2014

Y1 - 2014

N2 - Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.

AB - Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.

U2 - 10.1109/DDECS.2014.6868792

DO - 10.1109/DDECS.2014.6868792

M3 - Conference contribution

SN - 978-1-4799-4560-3

SP - 213

EP - 218

BT - 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

PB - Institute of Electrical and Electronics Engineers

ER -

Test and diagnosis of power switches

Abstract

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