Test and debug features of the RTO7 chip

K.M.M. Kaam, van, H.G.H. Vermeulen, H.J. Bergveld

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
136 Downloads (Pure)

Abstract

The Philips RTO7 chip consists of a complete receive chain from RF up to and including digital demodulation for Bluetooth-like radio communication. This paper describes both the implementation and verification of the test and debugs hardware for the digital core of the RTO7. The core-based DfT and DfD flow of the RTO7 is presented. The experimental results show that the RTO7 is both a fully testable and debuggable chip. State dump analysis results are also presented, showing that the state dumps obtained in the application are 100% stable, and match the state dumps made in simulation, and on the digital test system
Original languageEnglish
Title of host publicationProceedings of the IEEE International Test Conference, ITC 2005, 8 November 2005, Austin, Texas
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages12.1-1/10
ISBN (Print)0-7803-9038-5
DOIs
Publication statusPublished - 2005

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